Datasheet

DAC7568
DAC8168
DAC8568
SBAS430D –JANUARY 2009–REVISED MAY 2012 www.ti.com
ELECTRICAL CHARACTERISTICS (continued)
At AV
DD
= 2.7V to 5.5V and over –40°C to +125°C (unless otherwise noted).
DAC7568/DAC8168/DAC8568
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
AC PERFORMANCE
(3)
SNR 83 dB
T
A
= +25°C, BW = 20kHz, AV
DD
= 5V, f
OUT
= 1kHz,
THD –63 dB
first 19 harmonics removed for SNR calculation,
SFDR 63 dB
at 16-bit level
SINAD 62 dB
DAC output noise density T
A
= +25°C, at zero-code input, f
OUT
= 1kHz 90 nV/√Hz
DAC output noise T
A
= +25°C, at mid-code input, 0.1Hz to 10Hz 2.6 μV
PP
REFERENCE
AV
DD
= 5.5V 360 μA
Internal reference current consumption
AV
DD
= 3.6V 348 μA
External V
REF
= 2.5V (when internal reference is
External reference current 80 μA
disabled), all eight channels active
Grades A/B, AV
DD
= 2.7V to 5.5V 0 AV
DD
V
V
REF
IN Reference input range
Grades C/D, AV
DD
= 5.0V to 5.5V 0 AV
DD
/2 V
Reference input impedance 8 kΩ
REFERENCE OUTPUT
Output voltage T
A
= +25°C; all grades 2.4975 2.5 2.5025 V
Initial accuracy T
A
= +25°C, all grades –0.1 ±0.004 0.1 %
DAC7568/DAC8168/DAC8568
(4)
,grades A/B 5 25
Output voltage temperature drift ppm/°C
DAC7568/DAC8168/DAC8568
(5)
, grades C/D 2 5
Output voltage noise f = 0.1Hz to 10Hz 12 μV
PP
T
A
= +25°C, f = 1MHz, C
L
= 0μF 50
Output voltage noise density
T
A
= +25°C, f = 1MHz, C
L
= 1μF 20 nV/√Hz
(high-frequency noise)
T
A
= +25°C, f = 1MHz, C
L
= 4μF 16
Load regulation, sourcing
(6)
T
A
= +25°C 30 μV/mA
Load regulation, sinking
(6)
T
A
= +25°C 15 μV/mA
Output current load capability
(3)
±20 mA
Line regulation T
A
= +25°C 10 μV/V
Long-term stability/drift (aging)
(6)
T
A
= +25°C, time = 0 to 1900 hours 50 ppm
First cycle 100
Thermal hysteresis
(6)
ppm
Additional cycles 25
LOGIC INPUTS
(3)
Input current ±1 μA
V
IN
L Logic input LOW voltage 2.7V ≤ AV
DD
≤ 5.5V 0.3 × AV
DD
V
2.7V ≤ AV
DD
< 4.5V 0.7 × AV
DD
V
V
IN
H Logic input HIGH voltage
4.5V ≤ AV
DD
≤ 5.5V 0.625 × AV
DD
V
Pin capacitance 3 pF
(3) Specified by design or characterization; not production tested.
(4) Reference is trimmed and tested at room temperature, and is characterized from –40°C to +125°C.
(5) Reference is trimmed and tested at two temperatures (+25°C and +105°C), and is characterized from –40°C to +125°C.
(6) Explained in more detail in the Application Information section of this data sheet.
4 Submit Documentation Feedback Copyright © 2009–2012, Texas Instruments Incorporated
Product Folder Link(s): DAC7568 DAC8168 DAC8568