Datasheet
TIMING DIAGRAMS
t
8
CS
SCLK
InputDataRegisterand
DACLatchUpdated
(1)
DACLatchUpdated
SDI
BIT23(MSB)
BIT23(MSB)
BIT22 BIT1
Low
BIT0
LDAC
t
4
t
1
t
2
t
3
t
F
t
R
t
5
t
6
t
7
Case1:Stand-alonemode, tiedlowLDAC .
CS
SCLK
InputDataRegister Updated
butDACLatchisNotUpdated
SDI
BIT22 BIT1
High
BIT0
LDAC
t
1
t
2
t
3
t
F
t
R
t
7
t
9
Case2:Stand-alonemode, activehigh.LDAC
t
10
InputWordToWritetheDatatotheSelectedDAC
=Don’tCare
Bit23=MSB
Bit0=LSB
t
5
t
6
t
8
t
4
TIMING CHARACTERISTICS For Figure 1
(1) (2) (3)
DAC8234
www.ti.com
........................................................................................................................................... SBAS464A – AUGUST 2009 – REVISED SEPTEMBER 2009
Figure 1. SPI Timing for Stand-Alone Mode
At T
A
= – 40 ° C to +105 ° C, unless otherwise noted.
2.7V ≤ DV
DD
≤ 5.5V, 2.7V ≤ DV
DD
≤ 3.6V, 3.6V < DV
DD
≤ 5.5V,
IOV
DD
= 1.8V 2.7V ≤ IOV
DD
≤ DV
DD
2.7V ≤ IOV
DD
≤ DV
DD
PARAMETER MIN MAX MIN MAX MIN MAX UNIT
f
SCLK
Clock frequency 30 40 50 MHz
t
1
SCLK cycle time 33 25 20 ns
t
2
SCLK high time 16 12 10 ns
t
3
SCLK low time 16 12 10 ns
t
4
CS falling edge to SCLK falling edge
(4)
11 9 7 ns
t
5
Input data setup time 5 5 5 ns
t
6
Input data hold time 5 5 5 ns
t
7
SCLK falling edge to CS rising edge 15 12 10 ns
t
8
CS high time 60 50 30 ns
t
9
CS rising edge to LDAC falling edge 30 25 20 ns
t
10
LDAC pulse width 25 20 15 ns
RST pulse width 25 20 15 ns
(1) Specified by design and characterization.
(2) Sample tested during the initial release and after any redesign or process changes that may affect these parameters.
(3) All input signals are specified with t
R
= t
F
= 2ns (10% to 90% of IOV
DD
) and timed from a voltage level of IOV
DD
/2.
(4) The first SCLK edge after CS goes low must be a falling edge.
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