Datasheet
DAC8234
SBAS464A – AUGUST 2009 – REVISED SEPTEMBER 2009 ...........................................................................................................................................
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ELECTRICAL CHARACTERISTICS (continued)
All specifications at T
A
= T
MIN
to T
MAX
, AV
DD
= +11V to +18V, AV
SS
= – 11V to – 18V, V
REF
= REF-A = REF-B = +5V,
DV
DD
= +5V, IOV
DD
= +1.8V to DV
DD
, AGND = DGND = REFGND-A = REFGND-B = SGND-x = 0V, and DAC gain = 4, unless
otherwise noted.
DAC8234
PARAMETER CONDITIONS MIN TYP MAX UNIT
AC PERFORMANCE
(6)
To 0.03% of FS, C
L
= 200pF, R
L
= 10k Ω , output changes
6 µ s
from – 10V to +10V or +10V to – 10V
To 1 LSB, C
L
= 200pF, R
L
= 10k Ω , output changes from
Settling time 8 µ s
– 10V to +10V or +10V to – 10V
To 1 LSB, C
L
= 200pF, R
L
= 10k Ω , code changes 512
4 µ s
LSBs
Slew rate
(7)
C
L
= 200pF, R
L
= 10k Ω 5 V/ µ s
Recovery time from Delay from clearing bit PD-x to when DAC returns to
50 µ s
power-down mode normal operation
Digital-to-analog glitch
(8)
1 LSB code change around midscale 8 nV-s
Glitch impulse peak amplitude 1 LSB code change around midscale 15 mV
Channel-to-channel isolation
(9)
– 80 dB
DAC-to-DAC crosstalk
(10)
2 nV-s
Digital crosstalk
(11)
2 nV-s
Digital feedthrough
(12)
2 nV-s
0.1Hz to 10Hz, ± 10V output range, gain = 4, midscale code 1 µ V
RMS
Output noise
0.1Hz to 100kHz, ± 10V output range, gain = 4, midscale
40 µ V
RMS
code
1/f corner frequency 500 Hz
T
A
= +25 ° C, at 10kHz, ± 10V output range, gain = 4,
60 nV/ √ Hz
midscale code
Output noise spectral density
T
A
= +25 ° C, at 10kHz, 0V to +10V output range, gain = 2,
45 nV/ √ Hz
midscale code
MONITOR PIN (V
MON
)
(6)
Output impedance 2200 Ω
High-impedance leakage
100 nA
current
Continuous current limit 0.5 mA
REFERENCE INPUT
Reference input voltage range 1 8 V
Reference input dc impedance 10 100 M Ω
Reference input capacitance
(6)
20 pF
(6) Specified by design and characterization.
(7) Slew rate is measured from 10% to 90% of the transition when the output changes from negative full-scale to positive full-scale.
(8) Digital-to-analog glitch is defined as the amount of energy injected into the analog output at the major code transition. It is specified as
the area of the glitch in nV-s. It is measured by toggling the DAC register data between 0000h and FFFCh in twos complement format.
(9) Channel-to-channel isolation refers to the ratio of the signal amplitude at the output of one DAC channel to the amplitude of the
sinusoidal signal on the reference input of another DAC channel. It is expressed in dB and measured at midscale.
(10) DAC-to-DAC crosstalk is the glitch impulse that appears at the output of one DAC as a result of both the full-scale digital code and
subsequent analog output change at another DAC. It is measured with LDAC tied low and expressed in nV-s.
(11) Digital crosstalk is the glitch impulse transferred to the output of one converter as a result of a full-scale code change in the DAC input
register of another converter. It is measured when the DAC output is not updated, and is expressed in nV-s.
(12) Digital feedthrough is the glitch impulse injected to the output of a DAC as a result of a digital code change in the DAC input register of
the same DAC. It is measured with the full-scale digital code change without updating the DAC output, and is expressed in nV-s.
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