Datasheet

www.ti.com
A1
A0
1
2
3
4
5 6
7
8
10
9
V
OUT
A
V
OUT
B
GND
V
OUT
C
V
OUT
D
V
DD
SDA
SCL
DAC7574
DAC7574
SLAS375–JUNE 2003
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
PRODUCT PACKAGE PACKAGE SPECIFICATION PACKAGE ORDERING TRANSPORT MEDIA
DRAWING TEMPERATURE MARKING NUMBER
NUMBER RANGE
DAC7574 10-MSOP DGS -40°C TO +105°C D774 DAC7574IDGS 80 Piece Tube
DAC7574IDGSR 2500 Piece Tape and Reel
DGS PACKAGE
PIN DESCRIPTIONS
(TOPVIEW)
PIN NAME DESCRIPTION
1 V
OUT
A Analog output voltage from DAC A
2 V
OUT
B Analog output voltage from DAC B
Ground reference point for all circuitry on the
3 GND
part
4 V
OUT
C Analog output voltage from DAC C
5 V
OUT
D Analog output voltage from DAC D
6 SCL Serial clock input
7 SDA Serial data input and output
8 V
DD
Analog voltage supply input
9 A0 Device address select - I
2
C
10 A1 Device address select - I
2
C
ABSOLUTE MAXIMUM RATINGS
(1)
V
DD
to GND –0.3 V to +6 V
Digital input voltage to GND –0.3 V to V
DD
+ 0.3 V
V
OUT
to GND –0.3 V to V
DD
+ 0.3 V
Operating temperature range – 40°C to +105°C
Storage temperature range – 65°C to +150°C
Junction temperature range (T
J
max) +150°C
Power dissipation: Thermal impedance (ΘJA) 270°C/W
Thermal impedance (ΘJC) 77°C/W
Lead temperature, soldering: Vapor phase (60s) 215°C
Infrared (15s) 220°C
(1)
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2