Datasheet

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ABSOLUTE MAXIMUM RATINGS
DAC7558
SLAS435A – MAY 2005 – REVISED DECEMBER 2005
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
SPECIFIED
PACKAGE PACKAGE ORDERING TRANSPORT
PRODUCT PACKAGE TEMPERATURE
DESIGNATOR MARKING NUMBER MEDIA
RANGE
DAC7558IRHBT 250-piece Tape and
Reel
DAC7558 32 QFN RHB –40 °C TO 105 °C D758
DAC7558IRHBR 3000-piece Tape
and Reel
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
Web site at www.ti.com .
over operating free-air temperature range (unless otherwise noted)
(1)
UNIT
V
DD
, IOV
DD
to GND –0.3 V to 6 V
Digital input voltage to GND –0.3 V to V
DD
+ 0.3 V
V
out
to GND –0.3 V to V
DD
+ 0.3 V
Operating temperature range –40°C to 105°C
Storage temperature range –65°C to 150°C
Junction temperature (T
J
Max) 150°C
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2