Datasheet

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ABSOLUTE MAXIMUM RATINGS
DAC7553
SLAS477 SEPTEMBER 2005
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
SPECIFIED
PACKAGE PACKAGE ORDERING TRANSPORT
PRODUCT PACKAGE TEMPERATURE
DESIGNATOR MARKING NUMBER MEDIA
RANGE
DAC7553IRGTT 250-piece Tape and Reel
DAC7553 16 QFN RGT –40 °C TO 105 °C D753
DAC7553IRGTR 2500-piece Tape and Reel
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
Web site at www.ti.com .
over operating free-air temperature range (unless otherwise noted)
(1)
UNIT
V
DD
to GND –0.3 V to 6 V
Digital input voltage to GND –0.3 V to V
DD
+ 0.3 V
V
out
to GND –0.3 V to V
DD
+ 0.3 V
Operating temperature range –40°C to 105°C
Storage temperature range –65°C to 150°C
Junction temperature (T
J
Max) 150°C
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2