Datasheet

DAC7551-Q1
www.ti.com SLAS767 –JUNE 2011
ELECTRICAL CHARACTERISTICS
all specifications at –40°C to +105°C, V
DD
= 2.7V to 5.5V, V
REF
H = V
DD
, V
REF
L = GND, R
L
= 2kΩ to GND, and C
L
= 200pF to
GND (unless otherwise noted).
PARAMETER TEST CONDITIONS MIN TYP MAX UNITS
STATIC PERFORMANCE
(1)
Resolution 12 Bits
Relative accuracy ±0.35 ±1 LSB
Differential nonlinearity Specified monotonic by design ±0.08 ±0.5 LSB
Offset error ±12 mV
Zero-scale error All zeroes loaded to DAC register ±12 mV
Gain error ±0.15 %FSR
Full-scale error ±0.5 %FSR
Zero-scale error drift 7 μV/°C
ppm of
Gain temperature coefficient 3
FSR/°C
PSRR V
DD
= 5V 0.75 mV/V
OUTPUT CHARACTERISTICS
(2)
Output voltage range 2 x V
REF
L V
REF
H V
Output voltage settling time R
L
= 2kΩ, 0pF < C
L
< 200pF 5 μs
Slew rate 1.8 V/μs
R
L
= ∞ 470
Capacitive load stability pF
R
L
= 2kΩ 1000
Digital-to-analog glitch impulse 1 LSB change around major carry 0.1 nV-s
Digital feedthrough 0.1 nV-s
Output noise density 10kHz offset frequency 120 nV/√Hz
Total harmonic distortion f
OUT
= 1kHz, f
S
= 1MSPS, BW = 20kHz –85 dB
DC output impedance 1 Ω
V
DD
= 5V 50
Short-circuit current mA
V
DD
= 3V 20
Coming out of power-down mode, V
DD
= 5V 15
Power-up time μs
Coming out of power-down mode, V
DD
= 3V 15
REFERENCE INPUT
V
REF
H Input range 0 V
DD
V
V
REF
L Input range V
REF
L < V
REF
H 0 GND V
DD
V
Reference input impedance 100 kΩ
V
REF
= V
DD
= 5V 50 100
Reference current μA
V
REF
= V
DD
= 3V 30 60
LOGIC INPUTS
(2)
Input current ±1 μA
V
IN_L
, Input low voltage IOV
DD
≥ 2.7V 0.3 IOV
DD
V
V
IN_H
, Input high voltage IOV
DD
≥ 2.7V 0.7 IOV
DD
V
Pin capacitance 3 pF
(1) Linearity tested using a reduced code range of 30 to 4065; output unloaded.
(2) Specified by design and characterization; not production tested. For 1.8V < IOV
DD
< 2.7V, it is recommended that V
IH
≥ 0.8 IOV
DD
, and
V
IL
≤ 0.2 IOV
DD
.
Copyright © 2011, Texas Instruments Incorporated 3