Datasheet

ABSOLUTE MAXIMUM RATINGS
DAC5686
SLWS147F – APRIL 2003 – REVISED JUNE 2009 ............................................................................................................................................................ www.ti.com
Terminal Functions (continued)
TERMINAL
I/O DESCRIPTION
NAME NO.
SDIO 30 I/O Bidirectional serial-port data in the three-pin serial interface mode. Input-only serial data in the four-pin
serial interface mode. Internal pulldown
SDO 31 O High-impedance state (the pin is not used) in the three-pin serial interface mode. Serial-port output data
in the four-pin serial interface mode.
SLEEP 96 I Asynchronous hardware power-down input. Active high. Internal pulldown
TESTMODE 97 I TESTMODE is DGND for the user.
TxENABLE 33 I TxENABLE is used in interleaved mode. The rising edge of TxENABLE synchronizes the data of
channels A and B. The first data after the rising edge of TxENABLE is treated as A data, while the next
data is treated as B data and so on. In any mode, TxENABLE being low sets DAC outputs to midscale.
Internal pulldown
over operating free-air temperature range (unless otherwise noted)
(1)
UNIT
AVDD
(2)
– 0.5 V to 4 V
DVDD
(3)
– 0.5 V to 2.3 V
Supply voltage range CLKVDD
(2)
– 0.5 V to 4 V
IOVDD
(2)
– 0.5 V to 4 V
PLLVDD
(2)
– 0.5 V to 4 V
Voltage between AGND, DGND, CLKGND, PLLGND, and IOGND – 0.5 V to 0.5 V
AVDD to DVDD – 0.5 V to 2.6 V
DA[15:0]
(3)
– 0.5 V to IOVDD + 0.5 V
DB[15:0]
(3)
– 0.5 V to IOVDD + 0.5 V
SLEEP
(3)
– 0.5 V to IOVDD + 0.5 V
CLK1, CLK2, CLK1C, CLK2C
(3)
– 0.5 V to CLKVDD + 0.5 V
Supply voltage range
RESETB
(3)
– 0.5 V to IOVDD + 0.5 V
LPF
(3)
– 0.5 V to PLLVDD + 0.5 V
IOUT1, IOUT2
(2)
– 1 V to AVDD + 0.5 V
EXTIO, BIASJ
(2)
– 0.5 V to AVDD + 0.5 V
EXTLO
(2)
– 0.5 V to IOVDD + 0.5 V
Peak input current (any input) 20 mA
Operating free-air temperature range, T
A
: DAC5686I – 40C to 85C
Storage temperature range – 65C to 150C
Lead temperature 1,6 mm (1/16 inch) from the case for 10 seconds 260C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Measured with respect to AGND
(3) Measured with respect to DGND
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