Datasheet

ABSOLUTE MAXIMUM RATINGS
DAC5662
www.ti.com ................................................................................................................................................................ SLAS425B – JULY 2004 – REVISED MAY 2007
TERMINAL FUNCTIONS (continued)
TERMINAL
I/O DESCRIPTION
NAME NO.
DGND 15, 21 I Digital ground
DVDD 16, 22 I Digital supply voltage
EXTIO 43 I/O Internal reference output (bypass with 0.1 µ F to AGND) or external reference input.
GSET 42 I Gain-setting mode: H - 1 resistor, L - 2 resistors. Internal pullup.
IOUTA1 46 O DACA current output. Full-scale with all bits of DA high.
IOUTA2 45 O DACA complementary current output. Full-scale with all bits of DA low.
IOUTB1 39 O DACB current output. Full-scale with all bits of DB high.
IOUTB2 40 O DACB complementary current output. Full-scale with all bits of DB low.
MODE 48 I Mode Select: H – Dual Bus, L – Interleaved. Internal pullup.
13, 14, 35,
NC - No connection
36
Sleep function control input: H – DAC in power-down mode, L – DAC in operating mode. Internal
SLEEP 37 I
pulldown.
WRTA/WRTIQ 17 I Input write signal for PORT A (WRTIQ in interleaving mode).
WRTB/SELEC
20 I Input write signal for PORT B (SELECTIQ in interleaving mode).
TIQ
over operating free-air temperature range (unless otherwise noted)
(1)
UNIT
AVDD
(2)
-0.5 V to 4 V
Supply voltage range
DVDD
(3)
-0.5 V to 4 V
Voltage between AGND and DGND -0.5 V to 0.5 V
Voltage between AVDD and DVDD -0.5 V to 0.5 V
DA[11:0] and DB[11:0]
(3)
-0.5 V to DVDD + 0.5 V
MODE, SLEEP, CLKA, CLKB, WRTA, WRTB
(3)
-0.5 V to DVDD + 0.5 V
Supply voltage range
IOUTA1, IOUTA2, IOUTB1, IOUTB2
(2)
-1 V to AVDD + 0.5 V
EXTIO, BIASJ_A, BIASJ_B, GSET
(2)
-0.5 V to AVDD + 0.5 V
Peak input current (any input) +20 mA
Peak total input current (all inputs) -30 mA
Operating free-air temperature range -40 ° C to 85 ° C
Storage temperature range -65 ° C to 150 ° C
(1) Stresses beyond those listed under “ absolute maximum ratings ” may cause permanent damage to the device. These are stress ratings
only and functional operation of these or any other conditions beyond those indicated under “ recommended operating conditions ” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Measured with respect to AGND.
(3) Measured with respect to DGND.
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