Datasheet

DAC3152

DAC3162

SLAS736D –NOVEMBER 2010–REVISED AUGUST 2012

www.ti.com

POWER-UP SEQUENCE

The following start-up sequence is recommended to power up the DAC3152/DAC3162:

• Supply 1.8 V to DVDD18 and CLKVDD18 simultaneously, and 3.3 V to AVDD33. Within AVDD33, the

multiple AVDD33 pins should be powered up simultaneously. The 1.8-V and 3.3-V supplies can be powered

up simultaneously or in any order.

There are no specific requirements on the ramp rate for the supplies.

• Provide the DAC clock to the DACCLKP/N inputs.

• Toggle the SLEEPB pin for a minimum 25-ns low pulse duration.

• Provide the LVDS data inputs.

DEFINITION OF SPECIFICATIONS

Adjacent-Carrier Leakage Ratio (ACLR): Defined for a 3.84-Mcps 3GPP W-CDMA input signal measured in a

3.84-MHz bandwidth at a 5-MHz offset from the carrier with a 12-dB peak-to-average ratio.

Analog and Digital Power-Supply Rejection Ratio (APSRR, DPSRR): Defined as the percentage error in the

ratio of the delta IOUT and delta supply voltage normalized with respect to the ideal IOUT current.

Differential Nonlinearity (DNL): Defined as the variation in analog output associated with an ideal 1-LSB

change in the digital input code.

Gain Drift: Defined as the maximum change in gain, in terms of ppm of full-scale range (FSR) per °C, from the

value at ambient (25°C) to values over the full operating temperature range.

Gain Error: Defined as the percentage error (in FSR%) for the ratio between the measured full-scale output

current and the ideal full-scale output current.

Integral Nonlinearity (INL): Defined as the maximum deviation of the actual analog output from the ideal output,

determined by a straight line drawn from zero scale to full scale.

Intermodulation Distortion (IMD3): The two-tone IMD3 is defined as the ratio (in dBc) of the third-order

intermodulation distortion product to either fundamental output tone.

Offset Drift: Defined as the maximum change in dc offset, in terms of ppm of full-scale range (FSR) per °C, from

the value at ambient (25°C) to values over the full operating temperature range.

Offset Error: Defined as the percentage error (in FSR%) for the ratio between the measured mid-scale output

current and the ideal mid-scale output current.

Output Compliance Range: Defined as the minimum and maximum allowable voltage at the output of the

current-output DAC. Exceeding this limit may result in reduced reliability of the device or adversely affecting

distortion performance.

Reference Voltage Drift: Defined as the maximum change of the reference voltage in ppm per degree Celsius

from the value at ambient (25°C) to values over the full operating temperature range.

Noise Spectral Density (NSD): Defined as the difference of power (in dBc) between the output tone signal

power and the noise floor of 1 Hz bandwidth within the first Nyquist zone, excluding harmonics.

Signal-to-Noise Ratio (SNR): Defined as the ratio of the rms value of the fundamental output signal to the RMS

sum of all other spectral components below the Nyquist frequency, including noise, but excluding the first six

harmonics and dc.

Product Folder Links: DAC3152 DAC3162