Datasheet
DAC082S085
SNAS365F –MAY 2006–REVISED MARCH 2013
www.ti.com
Electrical Characteristics
(1)
The following specifications apply for V
A
= +2.7V to +5.5V, V
REFIN
= V
A
, C
L
= 200 pF to GND, f
SCLK
= 30 MHz, input code
range 3 to 252. Boldface limits apply for T
MIN
≤ T
A
≤ T
MAX
and all other limits are at T
A
= 25°C, unless otherwise specified.
Units
Symbol Parameter Conditions Typical
(2)
Limits
(2)
(Limits)
STATIC PERFORMANCE
Resolution 8 Bits (min)
Monotonicity 8 Bits (min)
INL Integral Non-Linearity ±0.14 ±0.5 LSB (max)
+0.04 +0.18 LSB (max)
DNL Differential Non-Linearity V
A
= 2.7V to 5.5V
−0.02 −0.13 LSB (min)
ZE Zero Code Error I
OUT
= 0 +4 +15 mV (max)
FSE Full-Scale Error I
OUT
= 0 −0.1 −0.75 %FSR (max)
GE Gain Error All ones Loaded to DAC register −0.2 −1.0 %FSR
ZCED Zero Code Error Drift −20 µV/°C
V
A
= 3V −0.7 ppm/°C
TC GE Gain Error Tempco
V
A
= 5V −1.0 ppm/°C
OUTPUT CHARACTERISTICS
0 V (min)
Output Voltage Range See
(3)
V
REFIN
V (max)
High-Impedance Output Leakage
I
OZ
±1 µA (max)
Current
(3)
V
A
= 3V, I
OUT
= 200 µA 1.3 mV
V
A
= 3V, I
OUT
= 1 mA 6.0 mV
ZCO Zero Code Output
V
A
= 5V, I
OUT
= 200 µA 7.0 mV
V
A
= 5V, I
OUT
= 1 mA 10.0 mV
V
A
= 3V, I
OUT
= 200 µA 2.984 V
V
A
= 3V, I
OUT
= 1 mA 2.934 V
FSO Full Scale Output
V
A
= 5V, I
OUT
= 200 µA 4.989 V
V
A
= 5V, I
OUT
= 1 mA 4.958 V
V
A
= 3V, V
OUT
= 0V, Input Code = FFh -56 mA
Output Short Circuit Current
I
OS
(source)
V
A
= 5V, V
OUT
= 0V, Input Code = FFh -69 mA
V
A
= 3V, V
OUT
= 3V, Input Code = 00h 52 mA
I
OS
Output Short Circuit Current (sink)
V
A
= 5V, V
OUT
= 5V, Input Code = 00h 75 mA
I
O
Continuous Output Current
(3)
Avaliable on each DAC output 11 mA (max)
R
L
= ∞ 1500 pF
C
L
Maximum Load Capacitance
R
L
= 2kΩ 1500 pF
Z
OUT
DC Output Impedance 7.5 Ω
REFERENCE INPUT CHARACTERISTICS
Input Range Minimum 0.2 1.0 V (min)
VREFIN Input Range Maximum V
A
V (max)
Input Impedance 60 kΩ
(1) To ensure accuracy, it is required that V
A
and V
REFIN
be well bypassed.
(2) Typical figures are at T
J
= 25°C, and represent most likely parametric norms. Test limits are specified to AOQL (Average Outgoing
Quality Level).
(3) This parameter is specified by design and/or characterization and is not tested in production.
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