Datasheet

CY74FCT16823T
CY74FCT162823T
3
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.
[5]
Max. Unit
V
IH
Input HIGH Voltage 2.0 V
V
IL
Input LOW Voltage 0.8 V
V
H
Input Hysteresis
[6]
100 mV
V
IK
Input Clamp Diode Voltage V
CC
=Min., I
IN
=−18 mA −0.7 −1.2 V
I
IH
Input HIGH Current V
CC
=Max., V
I
=V
CC
±1 µA
I
IL
Input LOW Current V
CC
=Max., V
I
=GND ±1 µA
I
OZH
High Impedance Output Current
(Three-State Output pins)
V
CC
=Max., V
OUT
=2.7V ±1 µA
I
OZL
High Impedance Output Current
(Three-State Output pins)
V
CC
=Max., V
OUT
=0.5V ±1 µA
I
OS
Short Circuit Current
[7]
V
CC
=Max., V
OUT
=GND −80 −140 −200 mA
I
O
Output Drive Current
[7]
V
CC
=Max., V
OUT
=2.5V −50 −180 mA
I
OFF
Power-Off Disable V
CC
=0V, V
OUT
≤4.5V
[8]
1 µA
Output Drive Characteristics for CY74FCT16823T
Parameter Description Test Conditions Min. Typ.
[5]
Max. Unit
V
OH
Output HIGH Voltage V
CC
=Min., I
OH
=−3 mA 2.5 3.5 V
V
CC
=Min., I
OH
=−15 mA 2.4 3.5
V
CC
=Min., I
OH
=−32 mA 2.0 3.0
V
OL
Output LOW Voltage V
CC
=Min., I
OL
=64 mA 0.2 0.55 V
Output Drive Characteristics for CY74FCT162823T
Parameter Description Test Conditions Min. Typ.
[5]
Max. Unit
I
ODL
Output LOW Voltage
[7]
V
CC
=5V, V
IN
=V
IH
or V
IL
, V
OUT
=1.5V 60 115 150 mA
I
ODH
Output HIGH Voltage
[7]
V
CC
=5V, V
IN
=V
IH
or V
IL
, V
OUT
=1.5V −60 −115 −150 mA
V
OH
Output HIGH Voltage V
CC
=Min., I
OH
=−24 mA 2.4 3.3 V
V
OL
Output LOW Voltage V
CC
=Min., I
OL
=24 mA 0.3 0.55 V
Capacitance
[9]
(T
A
= +25˚C, f = 1.0 MHz)
Parameter Description Test Conditions Typ.
[5]
Max. Unit
C
IN
Input Capacitance V
IN
= 0V 4.5 6.0 pF
C
OUT
Output Capacitance V
OUT
= 0V 5.5 8.0 pF
Notes:
5. Typical values are at V
CC
= 5.0V, T
A
= +25˚C ambient.
6. This input is specified but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
OS
tests should be performed last.
8. Tested at +25˚C.
9. This parameter is specified but not tested.