Datasheet

CY74FCT16841T
CY74FCT162841T
2
Maximum Ratings
[3, 4]
(Above which the useful life may be impaired. For user
guidelines, not tested.)
Storage Temperature......................................−55°C to +125°C
Ambient Temperature with
Power Applied..................................................−55°C to +125°C
DC Input Voltage .................................................−0.5V to +7.0V
DC Output Voltage ..............................................−0.5V to +7.0V
DC Output Current
(Maximum Sink Current/Pin) ...........................−60 to +120 mA
Power Dissipation ..........................................................1.0W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Pin Description
Name Description
D Data Inputs
LE Latch Enable Input (Active HIGH)
OE Output Enable Input (Active LOW)
O Three-State Outputs
Function Table
[1]
Inputs Outputs
D LE OE Q
H H L H
L H L L
X L L Q
[2]
X X H Z
Operating Range
Range
Ambient
Temperature V
CC
Industrial −40°C to +85°C 5V ± 10%
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.
[5]
Max. Unit
V
IH
Input HIGH Voltage Logic HIGH Level 2.0 V
V
IL
Input LOW Voltage Logic LOW Level 0.8 V
V
H
Input Hysteresis
[6]
100 mV
V
IK
Input Clamp Diode Voltage V
CC
=Min., I
IN
=−18 mA −0.7 −1.2 V
I
IH
Input HIGH Current V
CC
=Max., V
I
=V
CC
±1 µA
I
IL
Input LOW Current V
CC
=Max., V
I
=GND ±1 µA
I
OZH
High Impedance Output
Current (Three-State Output pins)
V
CC
=Max., V
OUT
=2.7V ±1 µA
I
OZL
High Impedance Output
Current (Three-State Output pins)
V
CC
=Max., V
OUT
=0.5V ±1 µA
I
OS
Short Circuit Current
[7]
V
CC
=Max., V
OUT
=GND −80 −140 −200 mA
I
O
Output Drive Current
[7]
V
CC
=Max., V
OUT
=2.5V −50 −180 mA
I
OFF
Power-Off Disable V
CC
=0V, V
OUT
≤4.5V
[8]
±1 µA
Notes:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = HIGH Impedance.
2. Output level before LE HIGH-to-LOW Transition.
3. Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature
range.
4. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
5. Typical values are at V
CC
= 5.0V, T
A
= +25˚C ambient.
6. This parameter is specified but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
OS
tests should be performed last.
8. Tested at +25˚C.