Datasheet

CY74FCT16543T
CY74FCT162543T
CY74FCT162H543T
3
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.
[5]
Max. Unit
V
IH
Input HIGH Voltage 2.0 V
V
IL
Input LOW Voltage 0.8 V
V
H
Input Hysteresis
[6]
100 mV
V
IK
Input Clamp Diode Voltage V
CC
=Min., I
IN
=−18 mA −0.7 −1.2 V
I
IH
Input HIGH Current V
CC
=Max., V
I
=V
CC
±1 µA
I
IL
Input LOW Current V
CC
=Max., V
I
=GND ±1 µA
I
OZH
High Impedance Output Cur-
rent (Three-State Output pins)
V
CC
=Max., V
OUT
=2.7V ±1 µA
I
OZL
High Impedance Output Cur-
rent (Three-State Output pins)
V
CC
=Max., V
OUT
=0.5V ±1 µA
I
OS
Short Circuit Current
[7]
V
CC
=Max., V
OUT
=GND −80 −140 −200 mA
I
O
Output Drive Current
[7]
V
CC
=Max., V
OUT
=2.5V −50 −180 mA
I
OFF
Power-Off Disable V
CC
=0V, V
OUT
≤4.5V
[8]
±1 µA
Notes:
1. A-to-B data flow shown; B-to-A flow control is the same, except using
CEBA, LEBA, and OEBA.
2. Data prior to LEAB LOW-to-HIGH Transition
H = HIGH Voltage Level. L = LOW Voltage Level.
X = Don’t Care. Z = High Impedance.
3. Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature
range.
4. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
5. Typical values are at V
CC
= 5.0V, T
A
= +25˚C ambient.
6. This parameter is specified but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
OS
tests should be performed last.
8. Tested at +25˚C.
9. On the 74FCT162H543T, these pins have bus hold.