Datasheet
CD4051B-Q1, CD4052B-Q1, CD4053B-Q1
CMOS ANALOG MULTIPLEXERS/DEMULTIPLEXERS
WITH LOGIC−LEVEL CONVERSION
SCHS354A − AUGUST 2004 − REVISED JANUARY 2008
7
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics, V
SUPPLY
= ±5 V, A
V
= 1 V, R
L
= 100 Ω, unless otherwise noted
(see Note 2) (continued)
PARAMETER
TEST CONDITIONS
V
EE
V
DD
LIMITS AT INDICATED
TEMPERATURES
UNIT
PARAMETER TEST CONDITIONS
V
EE
(V)
V
DD
(V)
40°C
125°C
25°C
UNIT
(V)
(V)
−40°C
125°C
MIN TYP MAX
Control (Address or Inhibit), V
C
V
IL
= V
DD
through 1kΩ,
V
SS
5 1.5 1.5 1.5
V
IL
Input low voltage
IL DD
g ,
V
IH
= V
DD
through 1kΩ,
R
L
=1kΩ to V
SS
V
SS
10 3 3 3
V
IL
pg
R
L
=
1kΩ
t
o
V
SS
,
I
is
< 2 µA on all OFF channels
V
SS
15 4 4 4
V
IL
= V
DD
through 1kΩ,
V
SS
5 3.5 3.5 3.5
V
IH
Input high voltage
IL DD
g ,
V
IH
= V
DD
through 1kΩ,
R
L
=1kΩ to V
SS
V
SS
10 7 7 7
V
IH
pg g
R
L
=
1kΩ
t
o
V
SS
,
I
is
< 2 µA on all OFF channels
V
SS
15 11 11 11
I
IN
Input current V
IN
= 0 V, 18 V 18 ±0.1 ±1 ±10
−5
±0.1 µA
Address-to-signal
t t
f
=20ns C
L
=50pF
0 5 450 720
t
Add
ress-to-s
i
gna
l
OUT
(
channels ON
t
r
, t
f
=
20
ns,
C
L
=
50
p
F
,
R
L
= 10 kΩ, V
SS
= 0 V,
0 10 160 320
ns
t
pd1
OUT
(channels
ON
or OFF) propagation
dl
R
L
=
10
kΩ
,
V
SS
=
0
V
,
See Figure 10, Figure 11, and
Fi 14
0 15 120 240
ns
)p p g
delay
gg
Figure 14
−5 5 225 450
Inhibit-to-signal
0 5 400 720
t
I
n
hibi
t-to-s
i
gna
l
OUT
(
channel
t
r
, t
f
= 20 ns, C
L
= 50 pF,
R 1kΩ V 0V
0 10 160 320
ns
t
pd2
OUT
(channel
turning ON)
ti d l
R
L
= 1 kΩ, V
SS
= 0 V,
See
Fi
gu
r
e
11
0 15 120 240
ns
g)
propagation delay
See
Figure
11
−10 5 200 400
Inhibit-to-signal
0 5 200 450
t
I
n
hibi
t-to-s
i
gna
l
OUT
(
channel
t
r
, t
f
= 20 ns, C
L
= 50 pF,
R 10 kΩ V 0V
0 10 90 210
ns
t
pd3
OUT
(channel
turning OFF)
ti d l
R
L
= 10 kΩ, V
SS
= 0 V,
See
Fi
gu
r
e
1
5
0 15 70 160
ns
g)
propagation delay
See
Figure
15
−10 5 130 300
C
IN
Input capacitance,
any address or
inhibit input
5 7.5 pF
NOTES: 2: Peak-to-peak voltage symmetrical about
V
DD
− V
EE
2
3: Determined by minimum feasible leakage measurement for automatic testing