Datasheet

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Tj − Continuous – °C
0
2
4
6
8
10
12
14
120 125 130 135 140 145 150 155 160
Electromigration Fail Mode
Years Estimated LIfe
Wirebond Voiding
Fail Mode
SN74ALVC164245-EP
16-BIT 2.5-V TO 3.3-V/3.3-V TO 5-V LEVEL-SHIFTING TRANSCEIVER
WITH 3-STATE OUTPUTS
SCAS774A – JUNE 2004 – REVISED SEPTEMBER 2005
74ALVC164245MDGG*EP
Estimated Device Life at Elevated Temperatures Electromigration
and Wirebond Voiding Fail Modes
A. Silicon operating life design goal is 10 years at 105 ° C junction temperature.
13