Datasheet

Vref
XT1
XT2
PUMP2S
PUMP2N
PUMP1S
PUMP1N
V2
Oscillator
PowerLAN™ Communications
Co
ntrol Logic
VLDO
+
+
SDI
SDO
V1
VSS
Internal
Temperature
PowerPump™
BalancingLogic
D S-
A/D
D S-
A/D
2.5V
LDO
Typical
Temp
Sensor
Typical
Temp
Sensor
Cell Balancing Circuits
B0345-01
bq76PL102
SLUS887A – DECEMBER 2008 – REVISED OCTOBER 2009 .......................................................................................................................................... www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
Figure 1. bq76PL102 Simplified Internal Block Diagram
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Product Folder Link(s) :bq76PL102