Datasheet

V
CELL
CB_EXT
I
bal
R
=
Test Mode Entered
15 V
> 10 ms
VDD
VC2
4 V
4.5 V
V
PROTECT
V V
PROTECT – HYST
<<t
d
(VC2–VC1)
or
(VC1–GND)
OUT
bq29200
bq29209
www.ti.com SLUSA52A –SEPTEMBER 2010–REVISED NOVEMBER 2010
CUSTOMER TEST MODE
Customer Test Mode (CTM) helps to greatly reduce the overvoltage detection delay time and enable quicker
customer production testing. This mode is intended for quick-pass board-level verification tests, and, as such,
individual cell overvoltage levels may deviate slightly from the specifications (V
PROTECT
, V
OA
). If accurate
overvoltage thresholds are to be tested, use the standard delay settings that are intended for normal use.
To enter CTM, VDD should be set to approximately 9.5 V higher than VC2. When CTM is entered, the device
switches from the normal overvoltage delay time scale factor, X
DELAY
, to a significantly reduced factor of
approximately 0.08, thereby reducing the delay time during an overvoltage condition.
CAUTION
Avoid exceeding any Absolute Maximum Voltages on any pins when placing the part
into CTM. Also, avoid exceeding Absolute Maximum Voltages for the individual cell
voltages (VC1–GND) and (VC2–VC1). Stressing the pins beyond the rated limits may
cause permanent damage to the device.
To exit CTM, power off the device and then power it back on.
Figure 10. Voltage Test Limits
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