Datasheet

bq28400
www.ti.com SLUSA61A –OCTOBER 2010–REVISED DECEMBER 2010
ELECTRICAL CHARACTERISTICS (continued)
Typical values stated where T
A
= 25ºC and V
BAT
= V
PACK
= 7.2 V, Min/Max values stated where T
A
= –20ºC to 85ºC and V
BAT
= V
PACK
= 3.8 V to 18.75 V over operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITION
(1)
MIN TYP MAX UNIT
SRx Wake from Sleep
V
WAKE
= 1.2 mV 0.2 1.2 2
V
WAKE
= 2.4 mV 0.4 2.4 3.6
V
WAKE_ACR
Accuracy of V
WAKE
mV
V
WAKE
= 5 mV 2 5 6.8
V
WAKE
= 10 mV 5.3 10 13
V
WAKE_TCO
Temperature drift of V
WAKE
accuracy 0.5 %/°C
t
WAKE
Time from application of current and wake of bq28400 0.2 1 ms
Coulomb Counter
Input voltage range –0.20 0.25 V
Conversion time Single conversion 250 ms
Effective resolution Single conversion 15 Bits
Integral nonlinearity T
A
= –20 to 85°C ±0.007 ±0.034 %FSR
Offset error
(3)
T
A
= –20 to 85°C 10 µV
Offset error drift 0.3 0.5 µV/°C
Full-scale error
(4)
–0.8% 0.2% 0.8%
Full-scale error drift 150 PPM/°C
Effective input ADC enabled 2.5 MΩ
resistance
ADC
Input voltage range for TS1 –0.2 0.8 x V
V
REG27
Conversion time 31.5 ms
Resolution (no missing codes) 16 Bits
Effective resolution 15 Bits
Integral nonlinearity –0.1 V to 0.8 x V
ref
±0.020 %FSR
Offset error
(5)
70 160 µV
Offset error drift 25 µV/°C
Full-scale error V
IN
= 1 V –0.8% ±0.2% 0.4%
Full –scale error drift 150 PPM/°C
Effective input resistance 8 MΩ
External Cell Balance Drive
Cell balance ON for VC1, VCx – VCx + 4 V,
3.7
Internal pull-down
where x = 1 to 2
R
BAL_drive
resistance for external kΩ
Cell balance ON for VC2, VCx – VCx + 4 V,
cell balance
1.75
where x = 1 to 2
Cell Voltage Monitor
CELL Voltage T
A
= –10ºC to 60ºC ±10 ±20
Measurement mV
T
A
= –20ºC to 85ºC ±10 ±35
Accuracy
(3) Post-Calibration Performance
(4) Uncalibrated performance. This gain error can be eliminated with external calibration.
(5) Channel to Channel Offset
Copyright © 2010, Texas Instruments Incorporated 7
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