Datasheet

bq27510-G2
www.ti.com SLUS948 –AUGUST 2010
LOW FREQUENCY OSCILLATOR
T
A
= –40°C to 85°C, 2.4 V < V
CC
< 2.6 V; typical values at T
A
= 25°C and V
CC
= 2.5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
f
OSC
Operating frequency 32.768 KHz
T
A
= 0°C to 60°C –1.5% 0.25% 1.5%
f
EIO
Frequency error
(1) (2)
T
A
= –20°C to 70°C –2.5% 0.25% 2.5%
T
A
= –40°C to 85°C -4.0% 0.25% 4.0%
t
SXO
Start-up time
(3)
500 ms
(1) The frequency drift is included and measured from the trimmed frequency at V
CC
= 2.5 V, T
A
= 25°C.
(2) The frequency error is measured from 32.768 KHz.
(3) The startup time is defined as the time it takes for the oscillator output frequency to be ±3% of typical oscillator frequency.
INTEGRATING ADC (COULOMB COUNTER) CHARACTERISTICS
T
A
= –40°C to 85°C, 2.4 V < V
CC
< 2.6 V; typical values at T
A
= 25°C and V
CC
= 2.5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
SR_IN
Input voltage range, V
(SRN)
and V
(SRP)
V
SR
= V
(SRN)
– V
(SRP)
–0.125 0.125 V
t
SR_CONV
Conversion time Single conversion 1 s
Resolution 14 15 bits
V
SR_OS
Input offset 10 mV
I
NL
Integral nonlinearity error ±0.007 ±0.034 %FSR
Z
SR_IN
Effective input resistance
(1)
2.5 MΩ
I
SR_LKG
Input leakage current
(1)
0.3 mA
(1) Assured by design. Not production tested.
ADC (TEMPERATURE AND CELL MEASUREMENT) CHARACTERISTICS
T
A
= –40°C to 85°C, 2.4 V < V
CC
< 2.6 V; typical values at T
A
= 25°C and V
CC
= 2.5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
ADC_IN
Input voltage range –0.2 1 V
t
ADC_CONV
Conversion time 125 ms
Resolution 14 15 bits
V
ADC_OS
Input offset 1 mV
Z
ADC1
Effective input resistance (TS)
(1)
8 MΩ
Z
ADC2
Effective input resistance (BAT)
(1)
bq27510-G2 not measuring cell voltage 8 MΩ
bq27510-G2 measuring cell voltage 100 kΩ
I
ADC_LKG
Input leakage current
(1)
0.3 mA
(1) Assured by design. Not production tested.
DATA FLASH MEMORY CHARACTERISTICS
T
A
= –40°C to 85°C, 2.4 V < V
CC
< 2.6 V; typical values at T
A
= 25°C and V
CC
= 2.5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
DR
Data retention
(1)
10 Years
Flash programming write-cycles
(1)
20,000 Cycles
t
WORDPROG)
Word programming time
(1)
2 ms
I
CCPROG)
Flash-write supply current
(1)
5 10 mA
(1) Assured by design. Not production tested.
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