Datasheet

Not Recommended for New Designs
bq27505
www.ti.com SLUS884–FEBRUARY 2009
3.8 ADC (TEMPERATURE AND CELL MEASUREMENT) CHARACTERISTICS
T
A
= –40°C to 85°C, 2.4 V < V
CC
< 2.6 V; typical values at T
A
= 25°C and V
CC
= 2.5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
IN(ADC)
Input voltage range –0.2 1 V
t
ADC_CONV
Conversion time 125 ms
Resolution 14 15 bits
V
OS(ADC)
Input offset 1 mV
Z
ADC1
Effective input resistance (TS)
(1)
8 MΩ
bq27505 not measuring cell voltage 8 MΩ
Z
ADC2
Effective input resistance (BAT)
(1)
bq27505 measuring cell voltage 100 kΩ
I
lkg(ADC)
Input leakage current
(1)
0.3 mA
(1) Specified by design. Not tested in production.
3.9 DATA FLASH MEMORY CHARACTERISTICS
T
A
= –40°C to 85°C, 2.4 V < V
CC
< 2.6 V; typical values at T
A
= 25°C and V
CC
= 2.5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
DR
Data retention
(1)
10 Years
Flash-programming write cycles
(1)
20,000 Cycles
t
WORDPROG
Word programming time
(1)
2 ms
I
CCPROG
Flash-write supply current
(1)
5 10 mA
t
DFERASE
Data flash master erase time
(1)
200 ms
t
IFERASE
Instruction flash master erase time
(1)
200 ms
t
PGERASE
Flash page erase time
(1)
20 ms
(1) Specified by design. Not production tested
Copyright © 2009, Texas Instruments Incorporated ELECTRICAL SPECIFICATIONS 7
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