Datasheet

3.8 INTEGRATING ADC (COULOMB COUNTER) CHARACTERISTICS
3.9 ADC (TEMPERATURE AND CELL MEASUREMENT) CHARACTERISTICS
3.10 DATA FLASH MEMORY CHARACTERISTICS
3.11 I
2
C-COMPATIBLE INTERFACE COMMUNICATION TIMING CHARACTERISTICS
bq27500
bq27501
System-Side Impedance Track™ Fuel Gauge
SLUS785D – SEPTEMBER 2007 – REVISED APRIL 2008 www.ti.com
T
A
= –40 ° C to 85 ° C, 2.4 V < V
CC
< 2.6 V; typical values at T
A
= 25 ° C and V
CC
= 2.5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
SR
Input voltage range (V
SR
= V
(SRN)
– V
(SRP)
) –0.125 0.125 V
t
SR_CONV
Conversion time Single conversion 1 s
Resolution 14 15 bits
V
SR_OS
Input offset 10 µ V
INL Integral nonlinearity error ± 0.007 ± 0.034 % FSR
Z
SR_IN
Effective input resistance
(1)
2.5 M Ω
I
SR_LKG
Input leakage current
(1)
0.3 µ A
(1) Specified by design. Not tested in production.
T
A
= –40 ° C to 85 ° C, 2.4 V < V
CC
< 2.6 V; typical values at T
A
= 25 ° C and V
CC
= 2.5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
ADC_IN
Input voltage range –0.2 1 V
t
ADC_CONV
Conversion time 125 ms
Resolution 14 15 bits
V
ADC_OS
Input offset 1 mV
Effective input resistance (TS, RID
Z
ADC1
8 M Ω
[bq27501 only])
(1)
bq27500/1 not measuring cell voltage 8 M Ω
Z
ADC2
Effective input resistance (BAT)
(1)
bq27500/1 measuging cell voltage 100 k Ω
I
ADC_LKG
Input leakage current
(1)
0.3 µ A
(1) Specified by design. Not tested in production.
T
A
= –40 ° C to 85 ° C, 2.4 V < V
CC
< 2.6 V; typical values at T
A
= 25 ° C and V
CC
= 2.5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
ON
Data retention
(1)
10 Years
Flash-programming write cycles
(1)
20,000 Cycles
t
WORDPROG
Word programming time
(1)
2 ms
I
CCPROG
Flash-write supply current
(1)
5 10 mA
(1) Specified by design. Not production tested
T
A
= –40 ° C to 85 ° C, 2.4 V < V
CC
< 2.6 V; typical values at T
A
= 25 ° C and V
CC
= 2.5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
r
SCL/SDA rise time 1 µ s
t
f
SCL/SDA fall time 300 ns
t
w(H)
SCL pulse duration (high) 4 µ s
t
w(L)
SCL pulse duration (low) 4.7 µ s
t
su(STA)
Setup for repeated start 4.7 µ s
t
d(STA)
Start to first falling edge of SCL 4 µ s
t
su(DAT)
Data setup time 250 ns
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