Datasheet

bq20z95
SLUS757C –JULY 2007–REVISED OCTOBER 2013 www.ti.com
TERMINAL FUNCTIONS (continued)
TERMINAL
I/O
(1)
DESCRIPTION
NO. NAME
Cell voltage sense input and cell balancing input for the positive voltage of the second lowest cell in
40 VC3 IA, P
cell stack and the negative voltage of the second highest cell in 4-series cell applications.
Cell voltage sense input and cell balancing input for the positive voltage of the second highest cell
41 VC2 IA, P and the negative voltage of the highest cell in 4 cell applications. Connect to VC3 in 2-cell stack
applications.
Cell voltage sense input and cell balancing input for the positive voltage of the highest cell in cell
42 VC1 IA, P
stack in 4-cell applications. Connect to VC2 in 3- or 2-series cell applications.
43 BAT I, P Battery stack voltage sense input
44 CHG O High side N-chan charge FET gate drive
ABSOLUTE MAXIMUM RATINGS
Over Operating Free-Air Temperature (unless otherwise noted)
(1)
DESCRIPTION PIN UNIT
VBAT, VCC –0.3 V to 34 V
PACK, PMS –0.3 V to 34 V
V
SS
Supply voltage range VC(n)-VC(n+1); n = 1, 2, 3, 4 –0.3 V to 8.5 V
VC1, VC2, VC3, VC4 –0.3 V to 34 V
VC5 –0.3 V to 1 V
PFIN, SMBD, SMBC, LED1, LED2,
–0.3 V to 6 V
LED3, LED4, LED5, DISP
TS1, TS2, SAFE, VCELL+, PRES;
–0.3 V to V
(REG25)
+ 0.3 V
V
IN
Input voltage range
ALERT
MRST, GSRN, GSRP, RBI –0.3 V to V
(REG25)
+ 0.3 V
ASRN, ASRP –1 V to 1 V
DSG, CHG, GPOD –0.3 V to 34 V
ZVCHG –0.3 V to V
(BAT)
V
OUT
Output voltage range TOUT, ALERT, REG33 –0.3 V to 6 V
RESET –0.3 V to 7 V
REG25 –0.3 V to 2.75 V
PRES, PFIN, SMBD, SMBC, LED5,
I
SS
Maximum combined sink current for input pins 50 mA
LED4, LED3, LED2, LED1
T
A
Operating free-air temperature range –40°C to 85°C
T
F
Functional temperature –40°C to 100°C
T
stg
Storage temperature range –65°C to 150°C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
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