Datasheet

1DSG
2PACK
3VCC
4ZVCHG
5
6PMS
7VSS
8REG33
9TOUT
10VCELL+
CHG
BAT
37
VC1
18
VC2
17
VC3
16
VC4
15
VC5
14
ASRP
13
ASRN
12
11
GPOD
19NC
PRES
TS2
PFIN
SAFE
SMBD
TS1
LED4
LED5
GSRP
23
GSRN
24
25
VSS
26
REG25
27
RBI
28
VSS
29
30
31
32
33
34
35
36
38
21
20
22
SMBC
DISP
VSS
43
39
40
41
42
44
LED1
LED2
LED3
RESET¯¯¯¯¯¯
¯¯¯¯¯MRST
ALERT
¯¯¯¯¯¯
¯¯¯¯
¯¯¯¯
¯¯¯¯¯
NC
Coloumb
Counter
HW Over
Current &
Short Circuit
Protection
Cell Voltage
Multiplexer
N-Channel FET
Drive
Pre Charge FET
& PGOD Drive
Power Mode
Control
SMBD
DISP
GSRN
GSRP ASRN
ASRP
GPOD
ZVCHG CHG DSG
VC5
VC4
VC3
VC2
VC1
¯¯¯¯¯
SMBC ¯¯¯¯¯¯
¯¯¯¯
¯¯¯¯
Cell Balancing
Temperature
Measurement
LED Display
Data Flash
Memory
SMB 1.1
Impedance
Track™
Gas Gauging
SHA-1
Authentication
Over- & Under-
Voltage
Protection
Voltage
Measurement
Over Current
Protection
Oscillator
Charging
Algorithm
Fuse Blow
Detection and
Logic
Over
Temperature
Protection
SAFE PFIN LED5 LED4 LED3 LED2 LED1
TS2
TS1
TOUT
PMS
Watchdog
Regulators
RESET
ALERT
¯¯¯¯¯¯
REG33
REG25
VCELL+
BAT PACK V
CC
VSS
MSRT
RBI
System Control AFE HW Control
Pack -
RSNS
5mΩ – 20mΩ typ.
Pack +
SMBC
SMBD
bq20z95
GNDVC4
VC3
VC2
VC1
VDD
OUT
CD
bq294xx
bq20z95
SLUS757C –JULY 2007–REVISED OCTOBER 2013 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
SYSTEM PARTITIONING DIAGRAM
bq20z95
DBT Package
(TOP VIEW)
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