Datasheet
bq20z655-R1
www.ti.com
SLUSAN9 –AUGUST 2011
ELECTRICAL CHARACTERISTICS (continued)
Over operating free-air temperature range (unless otherwise noted), T
A
= –40°C to 85°C, V
(REG25)
= 2.41 V to 2.59 V,
V
(BAT)
= 14 V, C
(REG25)
= 1 µF, C
(REG33)
= 2.2 µF; typical values at T
A
= 25°C (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
(SCC)
= 50 mV (min) 30 50 70
SCC detection threshold
V
(SCC)
V
(SCC)
= 200 mV; RSNS = 0, 1 180 200 220 mV
voltage accuracy
V
(SCC)
= 475 mV (max) 428 475 523
V
(SCD)
= –50 mV (min) –30 –50 –70
SCD detection threshold
V
(SCD)
V
(SCD)
= –200 mV; RSNS = 0, 1 –180 –200 –220 mV
voltage accuracy
V
(SCD)
= –475 mV (max) –428 –475 –523
t
da
Delay time accuracy ±15.25 μs
Protection circuit propagation
t
pd
50 μs
delay
FET DRIVE CIRCUIT; T
A
= 25°C (unless otherwise noted)
V
(DSGON)
= V
(DSG)
- V
(PACK)
;
V
(DSGON)
DSG pin output on voltage V
(GS)
connected to 10 MΩ; DSG and CHG on; 8 12 16 V
T
A
= –40°C to 100°C
V
(CHGON)
= V
(CHG)
- V
(BAT)
;
V
(CHGON)
CHG pin output on voltage V
(GS)
= 10 MΩ; DSG and CHG on; 8 12 16 V
T
A
= –40°C to 100°C
V
(DSGOFF)
DSG pin output off voltage V
(DSGOFF)
= V
(DSG)
- V
(PACK)
0.2 V
V
(CHGOFF)
CHG pin output off voltage V
(CHGOFF)
= V
(CHG)
- V
(BAT)
0.2 V
V
(CHG)
: V
(PACK)
≥ V
(PACK)
+ 4V 400 1000
t
r
Rise time C
L
= 4700 pF μs
V
(DSG)
: V
(BAT)
≥V
(BAT)
+ 4V 400 1000
V
(CHG)
: V
(PACK)
+ V
(CHGON)
≥ V
(PACK)
+
40 200
1V
t
f
Fall time C
L
= 4700 pF μs
V
(DSG)
: VC1 + V
(DSGON)
≥ VC1 + 1 V 40 200
V
(ZVCHG)
ZVCHG clamp voltage BAT = 4.5 V 3.3 3.5 3.7 V
LOGIC; T
A
= –40°C to 100°C (unless otherwise noted)
ALERT 60 100 200
R
(PULLUP)
Internal pullup resistance kΩ
RESET 1 3 6
ALERT 0.2
V
OL
Logic low output voltage level RESET; V
(BAT)
= 7 V; V
(REG25)
= 1.5 V; I
(RESET)
= 200 μA 0.4 V
GPOD; I
(GPOD)
= 50 μA 0.6
LOGIC SMBC, SMBD, PFIN, PRES, SAFE, ALERT, DISP
V
IH
High-level input voltage 2.0 V
V
IL
Low-level input voltage 0.8 V
V
REG25
–0.
V
OH
Output voltage high
(1)
I
L
= –0.5 mA V
5
V
OL
Low-level output voltage PRES, PFIN, ALERT, DISP; I
L
= 7 mA; 0.4 V
C
I
Input capacitance 5 pF
I
(SAFE)
SAFE source currents SAFE active, SAFE = V
(REG25)
–0.6 V –3 mA
I
lkg(SAFE)
SAFE leakage current SAFE inactive –0.2 0.2 µA
I
lkg
Input leakage current 1 µA
ADC
(2)
Input voltage range TS1, TS2, using Internal V
ref
–0.2 1 V
Conversion time 31.5 ms
Resolution (no missing
16 bits
codes)
Effective resolution 14 15 bits
Integral nonlinearity ±0.03 %FSR
(3)
Offset error
(4)
140 250 µV
Offset error drift
(4)
T
A
= 25°C to 85°C 2.5 18 μV/°C
(1) RC[0:7] bus
(2) Unless otherwise specified, the specification limits are valid at all measurement speed modes.
(3) Full-scale reference
(4) Post-calibration performance and no I/O changes during conversion with SRN as the ground reference.
Copyright © 2011, Texas Instruments Incorporated Submit Documentation Feedback 9
Product Folder Link(s): bq20z655-R1