Datasheet

DAC-x
DACx_Out
ADC
CHx
AMC7812
MUX
GUI Software and Operating Descriptions
www.ti.com
The first section is highlighted with the orange rectangle in Figure 10, and allows the user to make
modifications to high and low threshold register settings in the AMC7812 in addition to hysteresis register
settings. The second section of this tab, highlighted in red, is used to write settings to the DAC channel
registers. Modifications to DAC settings can either be applied channel by channel, or to all DAC channels
at the same time by using the Apply settings to: options also in the section of Figure 10 that is highlighted
in red.
The third section, highlighted in green in Figure 10, is used to write values to the output of DAC channels.
As with the DAC channel settings, data can be written channel by channel or written out to all channels by
using the Apply settings to: settings from the section highlighted in red. Users can write zero (0x000), full-
scale (0xFFF), or custom data values to each DAC channel.
The last section, highlighted in yellow, allows the user to customize what events will generate a DAC clear
event. For more details concerning DAC clear functions, or any other functions of the DAC registers on the
AMC7812, refer to the AMC7812 data sheet.
If the user is not using an external reference, the control for internal reference power in the middle of the
GUI (at the bottom of the screen) must be turned ON to use the DAC channels of the AMC7812.
7.6 Cooperation of DAC and ADC Tabs: An Analog Loopback Test
A test can be implemented to test the combined performance of the AMC7812 DAC and ADC, through the
cooperation of the DAC and ADC tabs discussed above, such as that shown in Figure 11.
Figure 11. AMC7812 Analog Loopback Test
22
AMC7812EVM-PDK User’s Guide SBAU177ASeptember 2010Revised May 2013
Submit Documentation Feedback
Copyright © 2010–2013, Texas Instruments Incorporated