Datasheet

AMC1203
SBAS427C –FEBRUARY 2008– REVISED JUNE 2011 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
(1)
SPECIFIED
PACKAGE TEMPERATURE PACKAGE ORDERING TRANSPORT MEDIA,
PRODUCT PACKAGE-LEAD DESIGNATOR RANGE MARKING NUMBER QUANTITY
AMC1203DUB Tube, 50
SOP-8 Gull-Wing DUB –40°C to +105°C AMC1203
AMC1203DUBR Tape and Reel, 350
AMC1203PSA Tube, 95
AMC1203 SOP-8 PSA –40°C to +105°C 1203
AMC1203PSAR Tape and Reel, 2000
AMC1203DW Tube, 40
SOIC-16 DW –40°C to +105°C AMC1203
AMC1203DWR Tape ad Reel, 2000
AMC1203BDUB Tube, 50
SOP-8 Gull-Wing DUB –40°C to +105°C AMC1203
AMC1203BDUBR Tape and Reel, 350
AMC1203BPSA Tube, 95
AMC1203B SOP-8 PSA –40°C to +105°C 1203
AMC1203BPSAR Tape and Reel, 2000
AMC1203BDW Tube, 40
SOIC-16 DW –40°C to +105°C AMC1203
AMC1203BDWR Tape and Reel, 2000
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the
device product folder on www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
PARAMETER AMC1203 UNIT
Supply voltage, V
DD1
to GND1 or V
DD2
to GND2 –0.3 to +6 V
Analog input voltage at V
IN+
, V
IN–
GND1 – 0.3 to V
DD1
+ 0.3 V
Input current to any pin except supply pins ±10 mA
Continuous total power dissipation See Dissipation Ratings Table
Maximum junction temperature, T
J
+150 °C
Human body model (HBM)
±3000 V
JEDEC standard 22, test method A114-C.01
Charged device Model (CDM)
Electrostatic discharge (ESD), all pins ±1500 V
JEDEC standard 22, test method C101
Machine Model (MM)
±200 V
JEDEC standard 22, test method A115A
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under the Recommended Operating
Conditions is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability.
2 Copyright © 2008–2011, Texas Instruments Incorporated