Datasheet
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PARAMETER MEASUREMENT INFORMATION
S1Open
S2Closed
5kΩ
S1
R
L
=2kΩ
V
CC
FromOutput
UnderTest
C
L
(seeNote A)
SeeNoteB
S2
t
PHL
V
OH
V
OL
2.5V
–2.5V
t
PLH
S1andS2Closed
VOLTAGEWAVEFORMSFORt
PLH
,t
PHL
TESTCIRCUIT
10%
90%
10%
90%
0
3V
10%
10%
90%
90%
1.3V1.3V
1.3V
1.3V
3V
0
≤5ns
10%
90%
10%
90%
0
3V
10%
10%
90%
90%
1.3V1.3V
1.3V
1.3V
3V
0
EnableG
EnableG
t
PZH
1.3V
Output
V
OH
0.5V
≈1.4V
t
PHZ
S1Closed
S2Closed
t
PZL
1.3V
S1Closed
S2Open
S1Closed
S2Closed
V
OL
0.5V
t
PLZ
VOLTAGEWAVEFORMSFORt
PHZ
,t
PZH
VOLTAGEWAVEFORMSFORt
PLZ
,t
PZL
Test
Point
Output
SeeNoteCSeeNoteC
Input
Output
EnableG
EnableG
≤5ns ≤5ns
≤5ns
≈1.4V
NOTES: A.C
L
includesprobeandjigcapacitance.
B. Alldiodesare1N3064orequivalent.
C.EnableGistestedwith G high; istestedwithGlow.G
00
1.3V
1.3V
AM26LS32AC , , AM26LS32AI , , AM26LS33AC
AM26LS32AM , AM26LS33AM
QUADRUPLE DIFFERENTIAL LINE RECEIVERS
SLLS115E – OCTOBER 1980 – REVISED OCTOBER 2007
Figure 1. Test Circuit and Voltage Waveforms
6 Submit Documentation Feedback Copyright © 1980 – 2007, Texas Instruments Incorporated
Product Folder Link(s): AM26LS32AC AM26LS32AI AM26LS33AC AM26LS32AM AM26LS33AM