Datasheet

AFE5805
SBOS421D MARCH 2008REVISED MARCH 2010
www.ti.com
DIGITAL CHARACTERISTICS
DC specifications refer to the condition where the digital outputs are not switching, but are permanently at a valid logic level
'0' or '1'. At C
LOAD
= 5pF
(1)
, I
OUT
= 3.5mA
(2)
, R
LOAD
= 100
(2)
, and no internal termination, unless otherwise noted.
AFE5805
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
DIGITAL INPUTS
High-level input voltage 1.4 3.3 V
Low-level input voltage 0 0.3 V
High-level input current 10 mA
Low-level input current
(3)
–10 mA
Input capacitance 3 pF
LVDS OUTPUTS
High-level output voltage 1375 mV
Low-level output voltage 1025 mV
Output differential voltage, |V
OD
| 350 mV
V
OS
output offset voltage
(2)
Common-mode voltage of OUTP and OUTM 1200 mV
Output capacitance inside the device,
Output capacitance 2 pF
from either output to ground
FCLKP and FCLKM 10 1x (clock rate) 50 MHz
LCLKP and LCLKM 60 6x (clock rate) 300 MHz
CLOCK
Clock input rate 10 50 MSPS
Clock duty cycle 50 %
Clock input amplitude, differential
Sine-wave, ac-coupled 3 V
PP
(VCLKP – VCLKM)
LVPECL, ac-coupled 1.6 V
PP
LVDS, ac-coupled 0.7 V
PP
Clock input amplitude, single-ended
(VCLKP)
High-level input voltage, V
IH
CMOS 2.2 V
Low-level input voltage, V
IL
CMOS 0.6 V
(1) C
LOAD
is the effective external single-ended load capacitance between each output pin and ground.
(2) I
OUT
refers to the LVDS buffer current setting; R
LOAD
is the differential load resistance between the LVDS output pair.
(3) Except pin J3 (INT/EXT), which has an internal pull-up resistor (52k) to 3.3V.
6 Submit Documentation Feedback Copyright © 2008–2010, Texas Instruments Incorporated
Product Folder Link(s): AFE5805