Datasheet

IN-0
IN-1
IN-62
+
-
X 1
Differential
Output
Driver
CDS-0
Sh-r
Sh-s
Sig
-
Rst
AFE0064
OUTP_0
OUTM_0
IN
<00>
IN
<01>
IN
<62>
CDS-1
Sh-r
Sh-s
CDS-62
Sh-r
Sh-s
IN-63
IN
<63>
CDS-63
Sh-r
Sh-s
EXT_C
+
-
X 1
Differential
Output
Driver
Sig
-
Rst
REF GEN
TIMINGS AND CONTROL
RPi
RMi
PREF
P_REF
REFM
REFP
OUTP_1
OUTM_1
o/p
control
SMT_MD
ENTRI
STO, EOC
INTG, IRST, SHS, SHR, CLK, PDZ,
NAPZ, ENTRI, STI, PGA 0-2, INTUPZ
CHARGE INJECTION
DF_SM,
VT-A,
VT-B
To
integrators
VDD
VSS
AFE0064
SLAS672 –SEPTEMBER 2009 ........................................................................................................................................................................................ www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
FUNCTIONAL BLOCK DIAGRAM
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Product Folder Link(s) :AFE0064