Datasheet

ADS8634

ADS8638

SBAS541A –MAY 2011– REVISED AUGUST 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

DEVICE COMPARISON

(1)

PRODUCT RESOLUTION CHANNELS SAMPLE RATE

ADS8634 4

12-Bit 1MSPS

ADS8638 8

(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the

device product folder at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

Over operating free-air temperature range, unless otherwise noted.

(1)

VALUE UNIT

AINn to AGND or AINGND to AGND HVSS – 0.3 to HVDD + 0.3 V

AVDD to AGND or DVDD to DGND –0.3 to 7 V

HVDD to AGND –0.3 to 18 V

HVSS to AGND –18 to 0.3 V

HVDD to HVSS –0.3 to 33 V

Digital input voltage to DGND –0.3 to DVDD + 0.3 V

Digital output to DGND –0.3 to DVDD + 0.3 V

Operating temperature range –40 to +125 °C

Storage temperature range –65 to +150 °C

Human body model (HBM) ±2000 V

ESD ratings, all pins

Charged device model (CDM) ±500 V

(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability. These are

stress ratings only and functional operation of the device at these or any other conditions beyond those specified in the Electrical

Characteristics table is not implied.

Product Folder Link(s): ADS8634 ADS8638