Datasheet

ADS8028
SBAS549B –MAY 2011–REVISED MARCH 2012 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
PACKAGE
PRODUCT PACKAGE-LEAD DESIGNATOR PACKAGE MARKING TRANSPORT MEDIA
Tape and Reel
ADS8028 QFN-20 RTJ ADS8028IRTJ
Tape and Reel
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
VALUE UNIT
AVDD to DGND, AGND –0.3 to +7 V
DVDD to DGND, AGND –0.3 to AVDD + 0.3 V
DGND to AGND –0.3 to +0.3 V
Analog input (AIN0 to AIN7) to AGND –0.3 to AVDD + 0.3 V
Digital input (CS, DIN, SCLK, PD/RST) to DGND –0.3 to DVDD + 0.3 V
Digital output (DOUT, TM_BUSY) to DGND –0.3 to DVDD + 0.3 V
REF to AGND AVDD + 0.3 V
Input current to any pin (except supply), continuous ±10 mA
Operating temperature range –40 to +125 °C
Storage temperature range –65 to +150 °C
Maximum junction temperature +150 °C
Human body model (HBM) ±2000 V
Electrostatic discharge
(ESD) ratings:
Charge device model (CDM) ±500 V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
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