Datasheet
ADS7886
www.ti.com
SLAS492A –SEPTEMBER 2005–REVISED NOVEMBER 2009
ABSOLUTE MAXIMUM RATINGS
(1)
UNIT
+IN to AGND –0.3 V to +V
DD
+0.3 V
+V
DD
to AGND –0.3 V to 7 V
Digital input voltage to GND –0.3 V to (7 V)
Digital output to GND –0.3 V to (+V
DD
+ 0.3 V)
Operating temperature range –40°C to 125°C
Storage temperature range –65°C to 150°C
Junction temperature (T
J
Max) 150°C
Power dissipation, SOT23 and SC70 packages (T
J
Max–T
A
)/θ
JA
SOT23 295.2°C/W
θ
JA
Thermal impedance
SC70 351.3°C/W
Vapor phase (60 sec) 215°C
Lead temperature, soldering
Infrared (15 sec) 220°C
(1) Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS
+V
DD
= 2.35 V to 5.25 V, T
A
= –40°C to 125°C, f
(sample)
= 1 MHz (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ANALOG INPUT
Full-scale input voltage span
(1)
0 V
DD
V
Absolute input voltage range +IN –0.2 V
DD
+0.2 V
C
I
Input capacitance
(2)
21 pF
I
lkg
Input leakage current T
A
= 125°C 40 nA
SYSTEM PERFORMANCE
Resolution 12 Bits
ADS7886SB 12
No missing codes Bits
ADS7886S 11
ADS7886SB –1.25 ±0.65 1.25
INL Integral nonlinearity LSB
(3)
ADS7886S 2 2
ADS7886SB –1 +0.4/-0.65 1
DNL Differential nonlinearity LSB
ADS7886S -2 2
V
DD
= 2.35 V to 3.6 V –2.5 ±0.5 2.5
E
O
Offset error
(4)
LSB
V
DD
= 4.75 V to 5.25 V -2 ±0.5 2
E
G
Gain error –1.75 ±0.5 1.75 LSB
SAMPLING DYNAMICS
Conversion time 20-MHz SCLK 760 800 ns
Acquisition time 325 ns
Maximum throughput rate 20-MHz SCLK 1 MHz
Aperture delay 5 ns
Step Response 160 ns
Overvoltage recovery 160 ns
DYNAMIC CHARACTERISTICS
V
DD
= 2.35 V to 3.6 V, f
I
= 100 kHz 69 71.25
SNR Signal-to-noise ratio dB
V
DD
= 4.75 V to 5.25 V, f
I
= 100 kHz 70 72.25
(1) Ideal input span; does not include gain or offset error.
(2) See Figure 28 for details on the sampling circuit.
(3) LSB means least significant bit.
(4) Measured relative to an ideal full-scale input.
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