Datasheet

SCLK
+IN
VDD
CDAC
SAR
COMPARATOR
OUTPUT
LATCHES
and
DRIVERS
3−STATE
CONVERSION
and
CONTROL
LOGIC
SDO
CS
ADS7886
SLAS492A –SEPTEMBER 2005–REVISED NOVEMBER 2009 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
(1)
MAXIMUM
MAXIMUM NO MISSING PACK-
DIFFER- PACK- TRANSPORT
INTEGRAL CODES AT AGE TEMPERATURE PACKAGE ORDERING
DEVICE ENTIAL AGE MEDIA
LINEARITY RESOLUTION DESIG- RANGE MARKING INFORMATION
LINEARITY TYPE QUANTITY
(LSB) (BIT) NATOR
(LSB)
Tape and
ADS7886SBDBVT
reel 250
6-Pin
DBV BBAQ
SOT23
Tape and
ADS7886SBDBVR
reel 3000
ADS7886SB ±1.25 ±1 12 –40°C to 125°C
Tape and
ADS7886SBDCKT
reel 250
6-Pin
DCK BNL
SC70
Tape and
ADS7886SBDCKR
reel 3000
Tape and
ADS7886SDBVT
reel 250
6-Pin
DBV BBAQ
SOT23
Tape and
ADS7886SDBVR
reel 3000
ADS7886S ±2 ±2 11 –40°C to 125°C
Tape and
ADS7886SDCKT
reel 250
6-Pin
DCK BNL
SC70
Tape and
ADS7886SDCKR
reel 3000
(1) For most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
2 Submit Documentation Feedback Copyright © 2005–2009, Texas Instruments Incorporated
Product Folder Link(s): ADS7886