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Basic Test Procedure

3 Basic Test Procedure

This section outlines the basic test procedure for testing the EVM.

3.1 Test Block Diagram

The test set-up for evaluation of the EVM with the TSW140x Capture Card is shown in Figure 6. As seen

in this figure, the evaluation setup involves a clock from a high-quality signal generator and a sine wave

for the analog input from a high-quality signal generator. High-order, narrow-bandpass filters are usually

required on clock and input frequency for removing phase noise and harmonic content from the input sine

waves. If the two signal generators are not synchronized by an external reference signal to make the clock

and input frequency coherent, then the resulting FFT first needs to have a windowing function such as

Hanning or Blackman-Harris applied to the data.

Figure 6. Test Setup Block Diagram

3.2 Test Set-up Connection

• Connect the J11 connector of the EVM to the J3 connector of TSW1400 or the J3 connector of

TSW1405

• Connect 5 V to the supply input of the TSW1400 and 5 V to the supply input of the EVM

• Provide sample clock at J1 of the EVM

• Provide analog input sine wave to Channel A, J4, or Channel B, J5

• Connect the USB cable from the TSW140x to a PC for the capture card GUI

• Connect the USB cable from the ADS540x to the computer if using the ADS540x SPI GUI

• Make sure the following jumpers at their default setting

– Initial jumper setting of ADS540x as per Table 1 (if default usage of the ADC is desired)

SLAU450–July 2012 ADS540x and ADS54T0x Evaluation Module (EVM)

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