Datasheet

ADS1672
SBAS402D –JUNE 2008–REVISED JULY 2010 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
For the most current package and ordering information, see the Package Option Addendum at the end of this
datasheet or see the TI website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range (unless otherwise noted).
PARAMETER ADS1672 UNIT
AVDD to AGND –0.3 to +6 V
DVDD to DGND –0.3 to +3.6 V
AGND to DGND –0.3 to +0.3 V
Momentary 100 mA
Input
current
Continuous 10 mA
Analog I/O to AGND –0.3 to AVDD +0.3 V
Digital I/O to DGND –0.3 to DVDD +0.3 V
Maximum junction temperature +150 °C
Operating temperature range –40 to +85 °C
Storage temperature range –60 to +150 °C
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
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