Datasheet
Device
EMI
Filter
To
ADC
PGA
3-Bit
DAC
(1)
COMP_TH[2:0]
Fault Detect
Control Register
FAULT_STATP
FAULT_STATN
+
-
INP
INN
AVDD
AVSS
R
R
Voltage
Or
Current
Sensing
ADS131E04
ADS131E06
ADS131E08
SBAS561A –JUNE 2012–REVISED APRIL 2013
www.ti.com
FAULT DETECTION
The ADS131E0x have integrated comparators that can be used in conjunction with the external pull-up or pull-
down resistors (R) to detect various fault conditions. The basic principle is to compare the input voltage with the
one set by the fault comparator 3-bit digital-to-analog converter (DAC), as shown in Figure 46. The comparator
trigger threshold level is set by the COMP_TH[2:0] bits in the FAULT register. Assuming that the ADS131E0x is
powered from ±2.5-V supply and COMP_TH[2:0] = 000 (95% and 5%), the high-side trigger threshold is set at
+2.25 V [equal to AVSS + (AVDD + AVSS) × 95%] and the low-side threshold is set at –2.25 V [equal to AVSS +
(AVDD + AVSS) × 5%]. The threshold calculation formula applies to unipolar as well as bipolar supplies.
A fault condition, such as an input signal going out of a predetermined range, can be detected by setting the
appropriate threshold level using the COMP_TH[2:0] bits. An open-circuit fault at the INP or INN pin can be
detected by using the external pull-up and pull-down resistors, which rail the corresponding input when the input
circuit breaks, causing the fault comparators to trip. To pinpoint which of the inputs is out of range, the status of
the FAULT_STATP and FAULT_STATN registers can be read, which is available as part of the output data
stream; see the Data Output (DOUT) subsection of the SPI Interface section.
(1) The configurable 3-bit DAC is common to all channels.
Figure 46. Fault Detect Comparators
48 Submit Documentation Feedback Copyright © 2012–2013, Texas Instruments Incorporated
Product Folder Links: ADS131E04 ADS131E06 ADS131E08