Datasheet

ADS1299
SBAS499A –JULY 2012–REVISED AUGUST 2012 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
FAMILY AND ORDERING INFORMATION
(1)
OPERATING
NUMBER OF MAXIMUM SAMPLE TEMPERATURE
PRODUCT PACKAGE OPTION CHANNELS ADC RESOLUTION RATE (kSPS) RANGE
ADS1299IPAG TQFP 8 24 16 –40°C to +85°C
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
VALUE UNIT
AVDD to AVSS –0.3 to +5.5 V
DVDD to DGND –0.3 to +3.9 V
AVSS to DGND –3 to +0.2 V
V
REF
input to AVSS AVSS – 0.3 to AVDD + 0.3 V
Analog input to AVSS AVSS – 0.3 to AVDD + 0.3 V
Digital input voltage to DGND –0.3 to DVDD + 0.3 V
Digital output voltage to DGND –0.3 to DVDD + 0.3 V
Momentary 100 mA
Input current
Continuous 10 mA
Operating range, T
A
–40 to +85 °C
Temperature Storage range, T
stg
–60 to +150 °C
Maximum junction, T
J
+150 °C
Human body model (HBM)
±1000 V
Electrostatic
JEDEC standard 22, test method A114-C.01, all pins
discharge (ESD)
Charged device model (CDM)
ratings
±500 V
JEDEC standard 22, test method C101, all pins
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
2 Copyright © 2012, Texas Instruments Incorporated