Datasheet
ADS1294, ADS1294R
ADS1296, ADS1296R
ADS1298, ADS1298R
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SBAS459I –JANUARY 2010–REVISED JANUARY 2012
CONFIG2: Configuration Register 2
Address = 02h
BIT 7 BIT 6 BIT 5 BIT 4 BIT 3 BIT 2 BIT 1 BIT 0
0 0 WCT_CHOP INT_TEST 0 TEST_AMP TEST_FREQ1 TEST_FREQ0
Configuration Register 2 configures the test signal generation. See the Input Multiplexer section for more details.
Bits[7:6] Must always be set to '0'
Bit 5 WCT_CHOP: WCT chopping scheme
This bit determines whether the chopping frequency of WCT amplifiers is variable or fixed.
0 = Chopping frequency varies, see Table 13
1 = Chopping frequency constant at f
MOD
/16
Bit 4 INT_TEST: TEST source
This bit determines the source for the Test signal.
0 = Test signals are driven externally (default)
1 = Test signals are generated internally
Bit 3 Must always be set to '0'
Bit 2 TEST_AMP: Test signal amplitude
These bits determine the calibration signal amplitude.
0 = 1 × –(VREFP – VREFN)/2.4mV (default)
1 = 2 × –(VREFP – VREFN)/2.4mV
Bits[1:0] TEST_FREQ[1:0]: Test signal frequency
These bits determine the calibration signal frequency.
00 = Pulsed at f
CLK
/2
21
(default)
01 = Pulsed at f
CLK
/2
20
10 = Not used
11 = At dc
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