Datasheet

ADS1291
ADS1292
ADS1292R
SBAS502B –DECEMBER 2011–REVISED SEPTEMBER 2012 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
FAMILY AND ORDERING INFORMATION
(1)
MAXIMUM OPERATING
PACKAGE PACKAGE NUMBER OF ADC SAMPLE TEMPERATUR RESPIRATION
PRODUCT OPTION DESIGNATOR CHANNELS RESOLUTION RATE (kSPS) E RANGE CIRCUITRY
TQFP PBS 1 24 8 –40°C to +85°C No
ADS1291I
QFN RSM 1 24 8 –40°C to +85°C No
TQFP PBS 2 24 8 –40°C to +85°C No
ADS1292I
QFN RSM 2 24 8 –40°C to +85°C No
TQFP PBS 2 24 8 –40°C to +85°C Yes
ADS1292RI
QFN RSM 2 24 8 –40°C to +85°C Yes
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
VALUE UNIT
AVDD to AVSS –0.3 to +5.5 V
DVDD to DGND –0.3 to +3.9 V
AVSS to DGND –3 to +0.2 V
Analog input to AVSS AVSS – 0.3 to AVDD + 0.3 V
Digital input to DVDD DVSS – 0.3 to DVDD + 0.3 V
Input current to any pin except supply pins ±10 mA
Momentary ±100 mA
Input current
Continuous ±10 mA
Operating temperature range –40 to +85 °C
Storage temperature range –60 to +150 °C
Maximum junction temperature (T
J
) +150 °C
Human body model (HBM)
±1000 V
JEDEC standard 22, test method A114-C.01, all pins
ESD ratings
Charged device model (CDM)
±500 V
JEDEC standard 22, test method C101, all pins
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
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