Datasheet

ADS1230
SBAS366B –OCTOBER 2006–REVISED SEPTEMBER 2012 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
For the most current package and ordering information, see the Package Option Addendum at the end of this
document, or see the TI website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
(1)
ADS1230 UNIT
AVDD to AGND –0.3 to +6 V
DVDD to DGND –0.3 to +6 V
AGND to DGND –0.3 to +0.3 V
100, Momentary mA
Input Current
10, Continuous mA
Analog Input Voltage to AGND –0.3 to AVDD + 0.3 V
Digital Input Voltage to DGND –0.3 to DVDD + 0.3 V
Maximum Junction Temperature +150 °C
Operating Temperature Range –40 to +85 °C
Storage Temperature Range –60 to +150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute-
maximum-rated conditions for extended periods may affect device reliability.
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