Datasheet

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ORDERING INFORMATION
ABSOLUTE MAXIMUM RATINGS
(1)
ADS1216
SBAS171D – NOVEMBER 2000 – REVISED SEPTEMBER 2006
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
For the most current package and ordering information see the Package Option Addendum at the end of this
document, or see the TI web site at www.ti.com .
ADS1216 UNIT
AV
DD
to AGND –0.3 to +6 V
DV
DD
to DGND –0.3 to +6 V
Input Current 100, Momentary mA
Input Current 10, Continuous mA
A
IN
GND – 0.5 to AV
DD
+ 0.5 V
AV
DD
to DV
DD
–6 to +6 V
AGND to DGND –0.3 to +0.3 V
Digital Input Voltage to GND –0.3 to DV
DD
+ 0.3 V
Digital Output Voltage to GND –0.3 to DV
DD
+ 0.3 V
Maximum Junction Temperature +150 ° C
Operating Temperature Range –40 to +85 ° C
Storage Temperature Range –60 to +100 ° C
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
2
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