Datasheet

ADS1194, ADS1196

ADS1198

SBAS471C –APRIL 2010– REVISED NOVEMBER 2011

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CONFIG2: Configuration Register 2

Address = 02h

BIT 7 BIT 6 BIT 5 BIT 4 BIT 3 BIT 2 BIT 1 BIT 0

0 0 1 INT_TEST 0 TEST_AMP TEST_FREQ1 TEST_FREQ0

Configuration Register 2 configures the test signal generation. See the Input Multiplexer section for more details.

Bits[7:6] Must always be set to '0'

Bits 5 Must always be set to '1'

Bit 4 INT_TEST: TEST source

This bit determines the source for the Test signal.

0 = Test signals are driven externally (default)

1 = Test signals are generated internally

Bit 3 Must always be set to '0'

Bit 2 TEST_AMP: Test signal amplitude

These bits determine the Calibration signal amplitude.

0 = –1 × (VREFP – VREFN)/2.4mV (default)

1 = –2 × (VREFP – VREFN)/2.4mV

Bits[1:0] TEST_FREQ[1:0]: Test signal frequency

These bits determine the calibration signal frequency.

00 = Pulsed at f

CLK

(default)

01 = Pulsed at f

CLK

10 = Not used

11 = At dc

Product Folder Link(s): ADS1194 ADS1196 ADS1198