Datasheet
ADS1146
ADS1147
ADS1148
SBAS453F –JULY 2009–REVISED APRIL 2012
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
(1)
DUAL SENSOR
EXCITATION
NUMBER OF VOLTAGE CURRENT PACKAGE-
PRODUCT RESOLUTION INPUTS REFERENCE SOURCES LEAD
1 Differential
ADS1246 24 bits or External NO TSSOP-16
1 Single-Ended
2 Differential
ADS1247 24 bits or Internal or External YES TSSOP-20
3 Single-Ended
4 Differential
ADS1248 24 bits or Internal or External YES TSSOP-28
7 Single-Ended
1 Differential
ADS1146 16 bits or External NO TSSOP-16
1 Single-Ended
2 Differential
ADS1147 16 bits or Internal or External YES TSSOP-20
3 Single-Ended
4 Differential
16 bits or Internal or External YES TSSOP-28
7 Single-Ended
ADS1148
4 Differential
16 bits or Internal or External YES QFN-32
7 Single-Ended
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder on www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
ADS1146, ADS1147, ADS1148 UNIT
AVDD to AVSS –0.3 to +5.5 V
AVSS to DGND –2.8 to +0.3 V
DVDD to DGND –0.3 to +5.5 V
100, momentary mA
Input current
10, continuous mA
Analog input voltage to AVSS AVSS – 0.3 to AVDD + 0.3 V
Digital input voltage to DGND –0.3 to DVDD + 0.3 V
Maximum junction temperature +150 °C
Operating temperature range –40 to +125 °C
Storage temperature range –60 to +150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute-
maximum-rated conditions for extended periods may affect device reliability.
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