Datasheet

ADC08060
www.ti.com SNAS120H –OCTOBER 2000–REVISED MARCH 2013
Converter Electrical Characteristics
The following specifications apply for V
A
= DR V
D
= +3.0V
DC
, V
RT
= +1.9V, V
RB
= 0.3V, C
L
= 10 pF, f
CLK
= 60 MHz at 50% duty
cycle. Boldface limits apply for T
J
= T
MIN
to T
MAX
: all other limits T
A
= 25°C
(1)(2)(3)
Units
Symbol Parameter Conditions Typical
(4)
Limits
(4)
(Limits)
DC ACCURACY
INL Integral Non-Linearity ±0.5 ±1.3 LSB (max)
+1.0 LSB (max)
DNL Differential Non-Linearity ±0.4
−0.9 LSB (min)
Missing Codes 0 (max)
FSE Full Scale Error 18 ±28 mV (max)
ZSE Zero Scale Offset Error 26 ±35 mV (max)
ANALOG INPUT AND REFERENCE CHARACTERISTICS
V
RB
V (min)
V
IN
Input Voltage 1.6
V
RT
V (max)
(CLK LOW) 3 pF
C
IN
V
IN
Input Capacitance V
IN
= 0.75V +0.5 Vrms
(CLK HIGH) 4 pF
R
IN
R
IN
Input Resistance >1 MΩ
BW Full Power Bandwidth 200 MHz
V
A
V (max)
V
RT
Top Reference Voltage 1.9
1.0 V (min)
V
RT
− 1.0 V (max)
V
RB
Bottom Reference Voltage 0.3
0 V (min)
1.0 V (min)
V
RT
- V
RB
Reference Delta 1.6
2.3 V (max)
150 Ω (min)
R
REF
Reference Ladder Resistance V
RT
to V
RB
220
300 Ω (max)
5.3 mA (min)
I
REF
Reference Ladder Current 7.3
10.6 mA (max)
(1) The Electrical characteristics tables list ensured specifications under the listed Recommended Conditions except as otherwise modified
or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations for room temperature only
and are not ensured.
(2) The analog inputs are protected as shown below. Input voltage magnitudes up to V
A
+ 300 mV or to 300 mV below GND will not
damage this device. However, errors in the A/D conversion can occur if the input goes above DR V
D
or below GND by more than 100
mV. For example, if V
A
is 2.7V
DC
the full-scale input voltage must be ≤2.6V
DC
to ensure accurate conversions.
(3) To ensure accuracy, it is required that V
A
and DR V
D
be well bypassed. Each supply pin must be decoupled with separate bypass
capacitors.
(4) Typical figures are at T
J
= 25°C, and represent most likely parametric norms at specific conditions at the time of product characterization
and are not ensured. Test limits are specified to TI's AOQL (Average Outgoing Quality Level).
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