User's Manual

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PRODUCTPREVIEW
17
CC2650MOD
www.ti.com
SWRS187 AUGUST 2016
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SpecificationsCopyright © 2016, Texas Instruments Incorporated
(1) °C/W = degrees Celsius per watt.
(2) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘ
JC
] value, which is based on a
JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
Power dissipation of 2 W and an ambient temperature of 70ºC is assumed.
(3) m/s = meters per second.
5.24 Thermal Resistance Characteristics for MOH Package
NAME DESCRIPTION °C/W
(1) (2)
AIR FLOW (m/s)
(3)
RΘ
JC
Junction-to-case 20.0
RΘ
JB
Junction-to-board 15.3
RΘ
JA
Junction-to-free air 29.6 0
RΘ
JMA
Junction-to-moving air 25.0 1
Psi
JT
Junction-to-package top 8.8 0
Psi
JB
Junction-to-board 14.8 0
(1) For smaller coin cell batteries, with high worst-case end-of-life equivalent source resistance, a 22-µF VDDS input capacitor (see
Section 7.1.1) must be used to ensure compliance with this slew rate.
(2) Applications using RCOSC_LF as sleep timer must also consider the drift in frequency caused by a change in temperature (see
Section 5.16).
(3) T
A
= 40°C to +85°C, V
DDS
= 1.7 V to 3.8 V, unless otherwise noted.
(4) T
c
= 25°C, V
DDS
= 3.0 V, unless otherwise noted. Device operating as SLAVE. For SSI MASTER operation, see Section 5.26.
(5) Refer to SSI timing diagrams Figure 5-1, Figure 5-2, and Figure 5-3.
5.25 Timing Requirements
MIN NOM MAX UNIT
Rising supply-voltage slew rate 0 100 mV/µs
Falling supply-voltage slew rate 0 20 mV/µs
Falling supply-voltage slew rate, with low-power flash settings
(1)
3 mV/µs
Positive temperature gradient in standby
(2)
No limitation for negative
temperature gradient, or
outside standby mode
5 °C/s
CONTROL INPUT AC CHARACTERISTICS
(3)
RESET_N low duration 1 µs
SYNCHRONOUS SERIAL INTERFACE (SSI)
(4)
S1 (SLAVE)
(5)
t
clk_per
SSIClk period 12 65024
system
clocks
S2
(5)
t
clk_high
SSIClk high time 0.5 t
clk_per
S3
(5)
t
clk_low
SSIClk low time 0.5 t
clk_per
(1) Device operating as MASTER. For SSI SLAVE operation, see Section 5.25.
(2) Refer to SSI timing diagrams Figure 5-1, Figure 5-2, and Figure 5-3.
5.26 Switching Characteristics
Measured on the TI CC2650EM-5XD reference design with T
c
= 25°C, V
DDS
= 3.0 V, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
WAKEUP AND TIMING
Idle Active 14 µs
Standby Active 151 µs
Shutdown Active 1015 µs
SYNCHRONOUS SERIAL INTERFACE (SSI)
(1)
S1 (TX only)
(2)
t
clk_per
(SSIClk period) One-way communication to SLAVE 4 65024
system
clocks
S1 (TX and RX)
(2)
t
clk_per
(SSIClk period) Normal duplex operation 8 65024
system
clocks