User's Manual

Assembly And Maintenance Manual for Telink Test System 2.1
AN-16052600-E3 25 Ver 1.2.0
Index
Name
Description
Parameter
Maintenance
Suggestion
25
IRCur
IR current test:
Make DUT enter IR state via
EVK and test the current at IR
state.
current value
IR current
problem. Check IR
circuit.
26
Amic
Amic test:
3V3DUT of EVK supplies power
for buzzer, while PIN48 outputs
high level to make buzzer
board generate square wave
signal which drives buzzer to
beep. Test DUT register value
at this state.
register value
Detect Amic circuit
27
FlashWrite
write flash:
write bin file into DUT flash
If err, err address;
if ok it’s 0
Flash related.
Maybe soldering
problem, re-solder
pins related to
Flash.
28
WriteID
write id(part of ieee id):
write ID information into DUT
flash
id
IEEE address to
verify Jig status.
Index 27 is fixed
value;
Index 28 is
dynamically
increasing value
29
WriteBytes
write bytes (part of ieee id):
write specific information into
DUT flash
id
30
FlashProtect
protect flash:
carry out write protect
operation for DUT flash
1, always
Flash related.
Maybe soldering
problem, re-solder
pins related to
Flash.
31
FlashWriteLarger
write flash:
check DUT flash content to
ensure correct burning
operation
If err, err address;
if ok it’s 0
32
Load
load status:
test connection between EVK
and DUT
No para
Contact problem.
Check contact
between thimble
and PCBA.