User's Manual
Table Of Contents
- 1 Overall Architecture Of 1x1 Test System 2.1
- 2 Hardware Platform Building
- 2.1 Check External Antenna
- 2.2 Cable connection
- 2.2.1 Connection points on EVK daughter board
- 2.2.2 Cable connection between EVK daughter board and PCB antenna
- 2.2.3 Cable connection between EVK daughter board and buzzer
- 2.2.4 Cable connection between EVK daughter board and Mechanical structure
- 2.2.5 Cable connection between EVK daughter board and DUT
- 2.2.6 Other cable connection
- 3 Firmware Burning For EVK Daughter Board
- 4 Observe Test Result Via PC Software EvkMonitor
- 5 Update PCBA (DUT) Firmware
- Appendix 1 Test Item List On PC Software “EvkMonitor”
- Appendix 2:Hardware List
- Appendix 3:Dimension chart of EVK daughter board and buzzer board
Assembly And Maintenance Manual for Telink Test System 2.1
AN-16052600-E3 24 Ver 1.2.0
Index
Name
Description
Parameter
Maintenance
Suggestion
12
RxLoCnt
rx low frequency counting
value/power/current test:
DUT receives packets
transmitted by EVK at low
frequency point, and thus to
test DUT Rx performance at
low frequency point.
Test parameters are EVK Tx
packet number, EVK Tx power
and EVK Tx current,
successively.
cnt num
RF related.
Test again; if
failed, temporarily
mark it as rejected
product, and wait
for subsequent
analysis.
13
RxLoPower
rf energy
14
RxLoCurrent
current value
15
RxHiCnt
rx high frequency counting
value/power/current test:
DUT receives packets
transmitted by EVK at high
frequency point, and thus to
test DUT Rx performance at
high frequency point.
Test parameters are EVK Tx
packet number, EVK Tx power
and EVK Tx current,
successively.
cnt num
16
RxHiPower
rf energy
17
RxHiCurrent
current value
18
CancleFlashProtection
cancel flash protection:
Cancel DUT flash write
protection for following flash
erase and test.
0, always
Flash related.
Maybe soldering
problem, re-solder
pins related to
Flash.
19
FlashZero
set flash as 0/ 0xff:
Write DUT flash with all “0” or
all “1” to test flash write
operation.
size
20
FlashErase
size
21
DsSlpCur
deep sleep current/wakeup,
suspend current/wakeup test:
Make DUT enter low-power
mode (deep sleep/suspend)
and then wake it up via EVK,
thus to test current in deep
sleep mode, wakeup function
from deep sleep mode, current
in suspend mode and wakeup
function from suspend mode.
current value
Maybe bad
contact with
thimble. Check if
there’s enough
solder paste for
the test points of
thimble and PCBA.
22
DsSlpWkp
reg value
23
SuspendCur
current value
24
SuspendWkp
reg value