Data Sheet

10
DC Voltage
Input Resistance 200mV,2V,20Vranges:Selectable10MΩor>10GΩ
(Fortheseranges,inputbeyond±26Vareclampedthrough106kΩ(typical)
200Vand1000Vranges;10MΩ±1%
Input Offset Current 50 pA, 25°C, typical
Input Protection 1000 V
CMRR (common mode rejection ratio) 140dBfor1kΩunbalanceinLOlead,±500VDCpeakmaximum
Resistance
Measurement Method Selectable 4-wire or 2-wire resistance
Current source referenced to LO input
Open-circuit Voltage Limited to <10 V
Max. Lead Resistance (4-wire) 10 %ofrangeperleadfor200Ω,2kΩranges,1kΩperleadonallotherranges
Offset Compensation Availableon200Ω,2kΩand20kΩranges
Input Protection 1000 V on all ranges
DC Current
Shunt Resistor 100Ωfor200µA,2mA
1Ωfor20mA,200mA
0.01Ωfor2A,10A
Input Protection Rear panel: accessible 10 A, 250 V fast-melt fuse
Internal 10 A, 250 V slow blow fuse for 2 A and 10 A ranges
Continuity/Diode Test
Measurement Method 1mA± 5 %constant-currentsourceoropen-circuitvoltage
Response Time 300 samples/sec, with audible tone
Beeper Yes
Diode Threshold Adjustable from 0 to 4 V
Continuity Threshold Adjustablefrom1Ωto2KΩ
Input Protection 1000 V
Settling Time Considerations
Reading settling times are affected by source impedance, cable dielectric characteristics and input signal changes.
The default measurement delay is selected to the correct reading for most measurements.
Measurement Considerations
Teflon or other high-impedance, low-dielectric absorption wire insulation is recommended for these measurements.
True RMS AC Voltage
Measurement Method AC-coupled True-RMS measurement with up to 400 V DC bias on any range.
Crest Factor ≤5atfullrange
Input Impedance 1MΩ±2 %inparallelwith<150pFcapacitanceonanyrange
Input Protection 750V rms on all ranges
AC Filter Bandwidth Slow: 3 Hz ~ 300 KHz
Medium: 20 Hz ~ 300 KHz
Fast: 200 Hz ~ 300 KHz
CMRR (common mode rejection ratio) 70dB,forthe1kΩunbalanceinLOlead,<60Hz,±500VDCpeakmaximum
MEASURING METHOD AND OTHER CHARACTERISTICS