User Manual
Table Of Contents
- Introduction TO QPHY-DDR3
- Signals measured
- DDR3 MEASUREMENT PREPARation
- Basic Functionality
- Using Qualiphy DDR3
- QualiPHY Compliance Test Platform
- QPHY-DDR3 Test Configurations
- 1) Clock tests DDR3-1333 (1 Probe)
- 2) CKdiff-DQse-DQSdiff 1333 Write Burst (3 Probes)
- 3) CKdiff-DQse-DQSdiff 1333 Read Burst (3 Probes)
- 4) Eye Diagram (3 Probes Debug)
- 5) Eye Diagram with CS Enabled (4 Probes Debug)
- 6) CKDiff-DQse-DQS-ADD/CTRLse (4 Probes Debug)
- 7) CKdiff-DQse-DQSp-DQsn (4 probes test, each DQS signal probed single ended)
- 8) CKp-CKn-DQse-DQSdiff (4 probe test, each CK signal is probed single ended)
- 9) Vref tests
- D1) Demo of All Tests
- QPHY-DDR3 Variables
- QPHY-DDR3 Limit Sets
- QPHY-DDR3 Tests
- Clock Tests
- tCK(avg), Average Clock Period
- tCK(abs), Absolute Clock Period
- tCH(avg), Average High Pulse Width
- tCL(avg), Average Low Pulse Width
- tCH(abs), Absolute High Pulse Width
- tCL(abs), Absolute Low Pulse Width
- tJIT(duty), Half Period Jitter
- tJIT(per), Clock Period Jitter
- tJIT(cc), Cycle to Cycle Period Jitter
- tERR(n per), Cumulative Error
- Eye Diagram
- Electrical Tests
- Timing Tests
- Four Probe tests measurements using ADDR/CTL
- Clock Tests

QPHY-DDR3 Software Opti on
917717 Rev C 5
VIH( dc), minimum DC input logic high ....................................................................................................................... 37
VIL(ac), maximum AC input logic low ......................................................................................................................... 38
VIL(dc), minimum DC input logic low ......................................................................................................................... 38
Read Bursts (Outputs) ...................................................................................................................................... 38
SRQ (Output Slew Rate) ................................................................................................................................................ 38
SRQr and SRQf ......................................................................................................................................................... 38
Ti ming Tests ............................................................................................................................................................. 38
Read Bursts ...................................................................................................................................................... 38
tDQSQ, DQS-DQ Skew for DQS and Associated DQ Signals ....................................................................................... 38
tQH, DQ/DQS Output Hold Time From DQS.................................................................................................................. 39
tDQSCK, DQS Output Access Time from CK/CK # ....................................................................................................... 39
Write Bursts ...................................................................................................................................................... 41
tDQSS, DQS latching rising transitions to associated CK edge ..................................................................................... 41
tDQSH, DQS Input High Pulse Width ............................................................................................................................. 41
tDQSL, DQS Input Low Pulse Width .............................................................................................................................. 41
tDSS, DQS Falling Edge to CK Setup Time ..................................................................................................... 42
tDSH, DQS Falling Edge Hold Time from CK ................................................................................................... 42
tDS(base), D Q and DM Input Setup Time ........................................................................................................ 42
tDH(base), DQ and DM Input Hold Time .......................................................................................................... 42
Four Probe tests measurements using ADDR/CTL ................................................................................................. 42
tIS /tIH (base) - Address and Control Input Setup Time (Hold Time) ............................................................... 42
tIPW, Control and Address Input pulse width for each input ............................................................................ 43
VIX(ac), AC Differential Input Cross Point Voltage ........................................................................................... 44